tag: Onto Innovation

Hidden Costs In Faster, Low-Power AI Systems
By Ed Sperling - 20 Jan, 2021 - Comments: 1

Chipmakers are building orders of magnitude better performance and energy efficiency into smart devices, but to achieve those goals they also are making tradeoffs that will have far-reaching, long-lasting, and in some cases unknown impacts. Much of this activity is a direct result of pushing intelligence out to the edge, where it is needed to process, sort, and manage massive increases in da... » read more

Week In Review: Auto, Security, Pervasive Computing
By SE Staff - 15 Jan, 2021 - Comments: 0

Automotive/Mobility Tesla has to recall 158,000 2012-2018 Model S and 2016-2018 Model X vehicles because of an eMMC NAND flash memory chip. The chip can cause the touchscreen to stop working when the memory reaches its limit of writes. According to a story in Reuters, the United States NHTSA (National Highway Traffic Safety Administration) is insisting on the recall because many of Tesla contr... » read more

Too Much Fab And Test Data, Low Utilization
By Anne Meixner - 12 Jan, 2021 - Comments: 7

Can there be such a thing as too much data in the semiconductor and electronics manufacturing process? The answer is, it depends. An estimated 80% or more of the data collected across the semiconductor supply chain is never looked at, from design to manufacturing and out into the field. While this may be surprising, there are some good reasons: Engineers only look at data necessary to s... » read more

Full Metrology Solutions For Advanced RF With Picosecond Ultrasonic Metrology
By Onto Innovation - 11 Jan, 2021 - Comments: 0

Picosecond Ultrasonics (PULSE Technology) has been widely used in thin metal film metrology because of its unique advantages, such as being a rapid, non-contact, non-destructive technology and its capabilities for simultaneous multiple layer measurement. Measuring velocity and thickness simultaneously for transparent and semi-transparent films offers a lot of potential for not only monitoring ... » read more

Variation Threat In Advanced Nodes, Packages Grows
By Ed Sperling - 21 Dec, 2020 - Comments: 0

Variation is becoming a much bigger and more complex problem for chipmakers as they push to the next process nodes or into increasingly dense advanced packages, raising concerns about the functionality and reliability of individual devices, and even entire systems. In the past, almost all concerns about variation focused on the manufacturing process. What printed on a piece of silicon didn't... » read more

Week In Review: Auto, Security, Pervasive Computing
By SE Staff - 18 Dec, 2020 - Comments: 0

Automotive Austin, Texas-based automotive startup Uhnder raised $45 million in Series C funding for its digital radar-on-chip. Telechips, a fabless semiconductor company that works on automotive SoCs, is using Arm’s IP to design its Dolphin5 SoC for ADAS (advanced drive assistance systems) and digital cockpits with in-vehicle infotainment (IVI). Dolphin5 will include the Arm’s Mali-G78A... » read more

3D NAND’s Vertical Scaling Race
By Mark LaPedus - 17 Dec, 2020 - Comments: 1

3D NAND suppliers are accelerating their efforts to move to the next technology nodes in a race against growing competition, but all of these vendors are facing an assortment of new business, manufacturing, and cost challenges. Two suppliers, Micron and SK Hynix, recently leapfrogged the competition and have taken the scaling race lead in 3D NAND. But Samsung and the Kioxia-Western Digital (... » read more

200mm Demand Surges
By Mark LaPedus - 17 Dec, 2020 - Comments: 1

A surge in demand for various chips is causing shortages for select 200mm foundry capacity as well as 200mm fab equipment, and it shows no signs of abating in 2021. Foundry customers will face a shortfall of 200mm capacity at select foundries at least in the first half of 2021, and perhaps beyond. Those customers will need to plan ahead to ensure they obtain enough 200mm capacity in 2021. Ot... » read more

Digital Test Bulks Up – Or Down
By Bryon Moyer - 08 Dec, 2020 - Comments: 2

Large digital integrated circuits are becoming harder to test in a time- and cost-efficient manner. AI chips, in particular, have tiled architectures that are putting pressure on older testing strategies due to the volume of test vectors required. In some cases, these chips are so large that they exceed reticle size, requiring them to be stitched together. New testing efficiencies are needed... » read more

Infrastructure Impacts Data Analytics
By Anne Meixner - 08 Dec, 2020 - Comments: 2

Semiconductor data analytics relies upon timely, error-free data from the manufacturing processes, but the IT infrastructure investment and engineering effort needed to deliver that data is, expensive, enormous, and still growing. The volume of data has ballooned at all points of data generation as equipment makers add more sensors into their tools, and as monitors are embedded into the chip... » read more

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