tag: proteanTecs

IC Test And Quality Requirements Drive New Collaboration
By Laura Peters - 09 Apr, 2024 - Comments: 0

Rapidly increasing chip and package complexity, coupled with an incessant demand for more reliability, has triggered a frenzy of alliances and working relationships that are starting to redefine how chips are tested and monitored. At the core of this shift is a growing recognition that no company can do everything, and that to work together will require much tighter integration of flows, met... » read more

The Rising Price Of Power In Chips
By Ed Sperling - 14 Mar, 2024 - Comments: 0

Power is everything when it comes to processing and storing data, and much of it isn't good. Power-related issues, particularly heat, dominate chip and system designs today, and those issues are widening and multiplying. Transistor density has reached a point where these tiny digital switches are generating more heat than can be removed through traditional means. That may sound manageable e... » read more

AI/ML Challenges In Test and Metrology
By Gregory Haley - 12 Mar, 2024 - Comments: 0

The integration of artificial intelligence and machine learning (AI/ML) into semiconductor test and metrology is redefining the landscape for chip fabrication, which will be essential at advanced nodes and in increasingly dense advanced packages. Fabs today are inundated by vast amounts of data collected across multiple manufacturing processes, and AI/ML solutions are viewed as essential for... » read more

Strategies For Detecting Sources Of Silent Data Corruption
By Anne Meixner - 12 Mar, 2024 - Comments: 0

Engineering teams are wrestling with how to identify the root causes of silent data corruption (SDC) in a timely and cost-effective way, but the solutions are turning out to be broader and more complex than simply fixing a single defect. This is particularly vexing for data center reliability, accessibility and serviceability (RAS) engineering teams, because even the best tools and methodolo... » read more

Examining The Impact Of Chip Power Reduction On Data Center Economics
By Noam Brousard - 12 Mar, 2024 - Comments: 1

In the rapidly evolving landscape of data centers, optimizing energy consumption has become a critical focus. In this blog post, we'll delve into the intricacies of power consumption, exploring the economics of three key components: CPUs, GPUs, and AI accelerators, and how the implementation of proteanTecs power reduction solution transforms both power efficiency and computational capabilities... » read more

Application-Specific Power Performance Optimizer Based On Chip Telemetry
By proteanTecs - 12 Mar, 2024 - Comments: 0

As datacenter power consumption continues to pose cooling and cost challenges, and battery driven devices are expected to last longer between charges, the search for advanced power management mechanisms continues. A modern design must balance between maximizing performance, consuming the least amount of power, and guaranteeing no failures in field. The latter requires safety margins which tr... » read more

Chip Industry Week In Review
By The SE Staff - 01 Mar, 2024 - Comments: 0

By Adam Kovac, Karen Heyman, and Liz Allan. India approved the construction of two fabs and a packaging house, for a total investment of about $15.2 billion, according to multiple sources. One fab will be jointly owned by Tata and Taiwan's Powerchip. The second fab will be a joint investment between CG Power, Japan's Renesas Electronics, and Thailand's Stars Microelectronics. Tata will run t... » read more

Adaptive Test Ramps For Data Intelligence Era
By Laura Peters - 08 Feb, 2024 - Comments: 0

Widely available and nearly unlimited compute resources, coupled with the availability of sophisticated algorithms, are opening the door to adaptive testing. But the speed at which this testing approach is adopted will continue to vary due to persistent concerns about data sharing and the potential for IP theft and data leakage. Adaptive testing is all about making timely changes to a test p... » read more

Hidden Costs And Tradeoffs In IC Quality
By Gregory Haley - 08 Feb, 2024 - Comments: 0

Balancing reliability against cost is becoming more difficult for semiconductor test, as chip complexity increases and devices become more domain-specific. Tests need to be efficient and effective without breaking the bank, while also ensuring chips are of sufficient quality for their specific application. The problem is that every new IC device adds its own set of challenges, from smaller f... » read more

From Data To Safety On-The-Road Hardware Health Monitoring
By proteanTecs - 07 Feb, 2024 - Comments: 0

The automotive industry is currently experiencing a transformation driven by electrification, connectivity, and autonomous driving. Vehicles require extensive computational capabilities and generate massive amounts of data. Future cars will embrace new architectures, becoming software-defined "computers on wheels" capable of hosting advanced applications, machine learning algorithms, and contin... » read more

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