Advanced Packaging Makes Testing More Complex


The limits of monolithic integration, together with advances in chip interconnect and packaging technologies, have spurred the growth of heterogeneous advanced packaging where multiple dies are co-packaged using 2.5D and 3D approaches. But this also raises complex test challenges, which are driving new standards and approaches to advanced-package testing. While many of the showstopper issues... » read more

Monitoring IC Abnormalities Before Failures


The rising complexities of semiconductor processes and design are driving an increasing use of on-chip monitors to support data analytics from an IC’s birth through its end of life — no matter how long that projected lifespan. Engineers have long used on-chip circuitry to assist with manufacturing test, silicon debug and failure analysis. Providing visibility and controllability of inter... » read more

Data Becomes Key For Next-Gen Chips


Data has become vital to understanding the useful life of a semiconductor — and the knowledge gleaned is key to staying competitive beyond Moore’s Law. What's changed is a growing reliance earlier in the design cycle on multiple sources of data, including some from further right in the design-through-manufacturing flow. While this holistic approach may seem logical enough, the semiconduc... » read more

RMAs: Root Problem Found


For decades, costs of production and maintenance have been driven down through manufacturing, process and logistical innovation, creating more breathing room for margin to maintain viable growth. There are other costs, however, that we seemingly accept as inevitable and simply get better at factoring in as par-for-the-course, or ‘eggs broken’ to make the omelet. The ubiquitous presence of ... » read more

Week In Review: Manufacturing, Test


Fast Arm-based supercomputer Japan has taken the lead in the supercomputer race, jumping ahead of the U.S. But China continues to make its presence felt in the arena. Fugaku, an ARM-based supercomputer jointly developed by Japan’s Riken and Fujitsu, is now ranked the world’s fastest supercomputer in the 55th TOP500 list. Fugaku turned in a high performance Linpack (HPL) result of 415.5... » read more

Week In Review: Auto, Security, Pervasive Computing


Security The U.S. Defense Advanced Research Projects Agency (DARPA) selected Synopsys as the main contractor to provide SoC design tools and security IP for its Automatic Implementation of Secure Silicon (AISS) program. The four-year program’s goal to develop a design tool and IP ecosystem to automate adding security into integrated circuits. Synopsys will be working on a research team with ... » read more

How To Improve DPPM By 10X Without Affecting Yield


Chips today are under immense pressure. With wider process variation manifested at wafer and die levels in single-digit nodes, highly complex designs, and effects of application and system integration, it’s no wonder the electronics value chain is becoming ever more reliant on expensive guard-bands. The ecosystem is not yet equipped to find all existing defects during test. So while quality e... » read more

Making Silicon Photonics Chips More Reliable


Silicon photonics has the ability to dramatically improve on-die and chip-to-chip communication within a package at extremely low power, but ensuring that signal integrity remains consistent over time isn't so simple. While this technology has been used commercially for at least the past decade, it never has achieved mainstream status. That's mostly due to the fact that Moore's Law scaling h... » read more

Ensuring HBM Reliability


Igor Elkanovich, CTO of GUC, and Evelyn Landman, CTO of proteanTecs, talk with Semiconductor Engineering about difficulties that crop up in advanced packaging, what’s redundant and what is not when using high-bandwidth memory, and how continuous in-circuit monitoring can identify potential problems before they happen. » read more

BiST Vs. In-Circuit Sensors


Monitoring the health of a chip post-manufacturing, including how it is aging and performing over time, is becoming much more important as ICs make their way into safety-critical applications such as the central brain in automobiles. Faced with longer lifespans and a growing body of functional safety rules, systems vendors need to be able to predict when a part will fail. But as sensing auto... » read more

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