Why Analog And Mixed-Signal Chips Resist Adaptive Test


Key Takeaways Analog and mixed-signal test remains heavily specification-based because the measurements do not always produce a single expected result. The absence of objective coverage metrics has historically encouraged conservative test flows, which IEEE 2427-2025 begins to address. Separating device behavior from test-path variation is a prerequisite for any adaptive flow—and h... » read more

The Sub-2nm Paradox


Key Takeaways: Process variation and physics are changing semiconductor design, manufacturing, and economics at 2nm and below. Even though new manufacturing processes are being introduced, it's taking longer for them to mature. The focus for many chip designs is faster data movement and more efficient computing, rather than just relying on more transistors per mm2. At 2nm an... » read more

Ensuring AI Reliability: Mitigating Silent Data Corruption Risks


Silent Data Corruption (SDC) is an industry challenge affecting data centers worldwide with increasing frequency. This phenomenon stems from untraceable hardware failures that make detection notoriously difficult. SDCs don’t leave any record in system logs or trigger exception mechanisms. The corrupted data they produce can propagate unnoticed, causing cascading failures that often demand ext... » read more

AI Accelerator Testing Depends On DFT Innovations


Key Takeaways: I/O and lane repair capabilities are becoming critical to improving yield. System-level testing catches marginal defects and rare defects such as silent data corruption errors. Synopsys and TSMC developed a multi-die demo vehicle capable of full test, monitor, debug, and repair capability across the system’s lifecycle. The proliferation of accelerators in AI... » read more

Smart Test Collides With The Data Chain


Key Takeaways: The promise of smart test is a data-chain problem before it is an algorithm problem. A device can pass every checkpoint and still carry a latent defect the test record never captured. As test grows more adaptive, the validity of the measurement environment matters as much as the measurement itself. For years, the test roadmap has pointed toward more adaptive f... » read more

Chip Industry Week In Review


Manufacturing ASE and WUS are jointly building a ~$1.1B advanced packaging hub in Kaohsiung, Taiwan, for fan-out chip-on-substrate (FOCoS) and flip-chip ball grid array (FC BGA) technologies. The new site is expected to be completed by September 2029. SpaceX filed documents for a “Terafab” semiconductor manufacturing and computing facility at Gibbons Creek Reservoir in Texas, with a... » read more

System-in-Package Challenges


Systems companies and leading-edge chipmakers are pushing past reticle limits with chiplet-based designs, often breaking compute-intensive functions into different chiplets and coupling those with other chiplets that may have been developed by different teams and at different process nodes. This is harder than it sounds, and results can vary widely even under the best circumstances. Nir Sever, ... » read more

Why Hardware Monitoring Needs Infrastructure, Not Just Sensors


Chipmakers need comprehensive hardware monitoring, with monitors (Agents) and sensors distributed throughout their devices, to manage the growing complexity and scale of modern SoCs. As designs now incorporate billions of transistors, multiple power and clock domains, and advanced process technologies, traditional characterization, test, and guard-banding approaches no longer provide sufficient... » read more

Chip Industry Week In Review


Deals, Funding Intel will join Elon Musk’s Terafab chip manufacturing project alongside Tesla, SpaceX, and xAI. Intel described its role as helping refactor silicon fab technology for a project targeting production of 1 TW/year of compute for AI and robotics applications. Intel and Google are expanding a multi-year collaboration on AI and cloud infrastructure, with Intel Xeon processo... » read more

What’s Failing At The Interface


Key Takeaways The interface is where failures in advanced packaging become visible, but it's increasingly not where they originate. Weak interfaces often don't fail at time zero, but they do degrade due to parametric drift and margin erosion that binary test screens miss entirely. The temporary test interconnect is the largest variable in the measurement chain and must be controlled ... » read more

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