Week In Review: Manufacturing, Test


Markets Worldwide semiconductor industry revenue is expected to grow 17.3% in 2021, compared with 10.8% in 2020, according to a new IDC report. Segment breakdown is as follows: [table id=5 /] “Semiconductor wafer prices increased in 1H21 and IDC expects increases to continue for the rest of 2021 due to material costs and opportunity cost in mature process technologies. Overall, IDC pre... » read more

Week In Review: Auto, Security, Pervasive Computing


Automotive Cadence announced its new platform for speeding up the creation of virtual and hybrid prototypes of complex systems, such as those found in automotive systems. The Cadence Helium Virtual and Hybrid Studio enables teams to verify embedded software and firmware on virtual and hybrid configurations before the RTL is ready, in systems where software and hardware need to be created simul... » read more

Making Test Transparent With Better Data


Data is critical for a variety of processes inside the fab. The challenge is getting enough consistent data from different equipment and then plugging it back into the design, manufacturing, and test flows to quickly improve the process and uncover hard-to-find defective die. Progress is being made. The inspection and test industry is on the cusp of having more dynamic ways to access the dat... » read more

Week In Review: Manufacturing, Test


Chipmakers, OEMs Reports have surfaced that TSMC has delayed its 3nm process. But TSMC says the technology remains on track. Volume production for TSMC’s 3nm is still scheduled for the second half of 2022. On the flip side, there is speculation that TSMC may increase its wafer prices by up to 20%, according to a report from the Taipei Times. Here's another report. This is due to chip shortag... » read more

Week In Review: Auto, Security, Pervasive Computing


Automotive The chip shortage continues to affect automotive OEMs around the world. Ford is cutting production of its F-150 pickup truck. It is not just passenger car production that is affected. The transportation industry will see chip shortages with 5+ month lead times through the end of 2021, according to ABI Research. Some of the shortages will be in telematics chips, due to high demand wh... » read more

Designing Chips For Test Data


Collecting data to determine the health of a chip throughout its lifecycle is becoming necessary as chips are used in more critical applications, but being able to access that data isn't always so simple. It requires moving signals through a complex, sometimes unpredictable, and often hostile environment, which is a daunting challenge under the best of conditions. There is a growing sense of... » read more

Who Owns In-Chip Monitoring Data?


In-chip monitors provide unprecedented visibility into the inner workings of complex integrated circuits for everything from process control to fine binning, preventive system maintenance, and failure analysis. But there may be many consumers of different slices of the data at very different phases of the chip lifecycle, raising questions about who controls and owns all of that data. The ans... » read more

Multi-Layer Deep Data Performance Monitoring And Optimization


Combining functional and parametric monitoring of the real-world behavior of complex SoCs provides a powerful new approach that facilitates performance optimization during development and in the field, improves security and safety, and enables predictive maintenance to prevent field failures. proteanTecs’ Universal Chip Telemetry (UCT) and Siemens’ Tessent Embedded Analytics are complementa... » read more

Geo-Spatial Outlier Detection


Comparing die test results with other die on a wafer helps identify outliers, but combining that data with the exact location of an outlier offers a much deeper understanding of what can go wrong and why. The main idea in outlier detection is to find something in or on a die that is different from all the other dies on a wafer. Doing this in the context of a die’s neighbor has become easie... » read more

IC Data Hot Potato: Who Owns And Manages It?


Modern inspection, metrology, and test equipment produces a flood of data during the manufacturing and testing of semiconductors. Now the question is what to do with all of that data. Image resolutions in inspection and metrology have been improving for some time to deal with increased density and smaller features, creating a downstream effect that has largely gone unmanaged. Higher resoluti... » read more

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