tag: quality

Avoiding Traffic Jams In SoC Design
By Kurt Shuler - 28 Aug, 2017 - Comments: 0

While sitting in a traffic jam on the way to work, I realized that the sheer volume of vehicles on the road exceeds the capacity originally planned for by civil engineers, when highways first hit the drawing boards 50 or 60 years ago. It dawned on me that there is a parallel to today’s System-on-Chip design—engineers are struggling to close timing on the interconnect during the back-end pla... » read more

How Reliable Are FinFETs?
By Ann Mutschler - 16 Aug, 2017 - Comments: 1

Stringent safety requirements in the automotive and industrial sectors are forcing chipmakers to re-examine a number of factors that can impact reliability over the lifespan of a device. Many of these concerns are not new. Electrical overstress (EOS), electrostatic discharge (ESD) and [getkc id="160" kc_name="electromigration"] (EM) are well understood, and have been addressed by EDA tools f... » read more

Are All Known Good Tested Devices Created Equal?
By Guy Cortez - 10 Jul, 2017 - Comments: 0

Your known good parts all had passed their required wafer sort, final test, and system-level tests and were shipped to your customers. However, as we all know, a known good part or device sometimes does not stay good and may end up failing prematurely in the field and flagged as an RMA (return material authorization) by your customer. But why is it that some good parts fail early and others las... » read more

Tracking Down Errors With Data
By Ed Sperling - 10 Jul, 2017 - Comments: 0

Michael Schuldenfrei, CTO at [getentity id="22929" comment="Optimal+"], sat down with Semiconductor Engineering to discuss how data will be used and secured in the future, the accuracy of that data, and what impact it can have on manufacturing. What follows are excerpts of that conversation. SE: Can data be shared across the supply chain? Schuldenfrei: We believe it has to happen. If it d... » read more

Chip Test Shifts Left
By Jeff Dorsch - 07 Jun, 2017 - Comments: 0

“Shift left” is a term traditionally applied to software testing, meaning to take action earlier in the V-shaped time line of a project. It has recently been touted in electronic design automation and IC design, verification, and test. “Test early and test often” is the classic maxim of software testing. What if that concept could also be implemented in semiconductor testing, to redu... » read more

Focus Shifts To System Quality
By Ed Sperling - 05 Jun, 2017 - Comments: 0

For the past decade, many semiconductor industry insiders predicted that software would take over the world and hardware would become commoditized. The pendulum seems to have stopped, and if anything, it is reversing course. Initial predictions were based on several advantages for software. First, software is easier to modify and patch. Second, universities turn out far more software develop... » read more

Verification And The IoT
By Ed Sperling - 31 May, 2017 - Comments: 0

Semiconductor Engineering sat down to discuss what impact the IoT will have on the design cycle, with Christopher Lawless, director of external customer acceleration in [getentity id="22846" e_name="Intel"]'s Software Services Group; David Lacey, design and verification technologist at Hewlett Packard Enterprise; Jim Hogan, managing partner at Vista Ventures; Frank Schirrmeister, senior group d... » read more

IIoT Analytics
By Optimal Plus - 08 May, 2017 - Comments: 0

Founded in 1995, Marvell Technology Group Ltd. has operations worldwide and more than 7,000 employees. A leading fabless semiconductor company, Marvell ships over one billion chips a year. Marvell’s expertise in microprocessor architecture and digital signal processing, drives multiple platforms including high volume storage solutions, mobile and wireless, networking, consumer and green pr... » read more

Verification And The IoT
By Ed Sperling - 04 May, 2017 - Comments: 0

Semiconductor Engineering sat down to discuss what impact the IoT will have on the design cycle, with Christopher Lawless, director of external customer acceleration in [getentity id="22846" e_name="Intel"]'s Software Services Group; David Lacey, design and verification technologist at Hewlett Packard Enterprise; Jim Hogan, managing partner at Vista Ventures; Frank Schirrmeister, senior group d... » read more

Is Product Quality Getting Lost In The IIoT?
By David Park - 10 Apr, 2017 - Comments: 0

Manufacturing operations have continuously evolved using data capture and management to assess and test production effectiveness on the manufacturing floor. The advent of the Industrial Internet of Things (IIoT) and its anticipated ability to track and manage the factory environment with machine-to-machine process analytics heralds yet another transformation, promising a higher level of data in... » read more

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