Blog Review: Nov. 20


Siemens’ Jonathan Muirhead explains why matching and symmetry are so important for analog and RF circuits, especially in topological structures like differential pairs and current mirrors, and introduces checking techniques to ensure compliance. Cadence's Satish Kumar Padhi examines the significance of randomization in PCIe IDE verification, focusing on how it ensures data integrity and en... » read more

Harnessing Computational Storage For Faster Data Processing


By Ujjwal Negi and Prashant Dixit In the evolving landscape of data storage, computational storage devices (CSDs) are revolutionizing how we process and store data. By embedding processing capabilities within storage units, these devices enable in-situ data manipulation, minimizing data movement between storage and CPUs and dramatically improving performance and efficiency. This paradigm shi... » read more

Shift Left Is The Tip Of The Iceberg


Shift left is evolving from a buzzword into a much broader shift in design methodology and EDA tooling, and while it's still early innings there is widespread agreement that it will be transformative. The semiconductor industry has gone through many changes over the past few decades. Some are obvious, but others happen because of a convergence of multiple factors that require systemic change... » read more

Accelerating Verification Of Computational Storage Designs Using Avery NVMe Verification IP


Computational storage is an emerging paradigm that integrates processing capabilities directly within storage devices. This paper outlines how this approach addresses the limitations of traditional NVM Express (NVMe) SSDs and the performance characteristics of the newly introduced compute and subsystem local memory (SLM) namespaces. The paper also focuses on the verification framework provided ... » read more

New AI Data Types Emerge


AI is all about data, and the representation of the data matters strongly. But after focusing primarily on 8-bit integers and 32‑bit floating-point numbers, the industry is now looking at new formats. There is no single best type for every situation, because the choice depends on the type of AI model, whether accuracy, performance, or power is prioritized, and where the computing happens, ... » read more

RISC-V’s Software Portability Challenge


Experts At The Table: RISC-V provides a platform for customization, but verifying those changes remains challenging. Semiconductor Engineering discussed the issue with John Min, vice president of customer service at Arteris; Zdeněk Přikryl, CTO of Codasip; Neil Hand, director of marketing at Siemens EDA (at the time of this discussion); Frank Schirrmeister, executive director for strategi... » read more

Advanced Packaging Drives Test And Metrology Innovations


Advanced packaging has become a focal point for innovation as the semiconductor industry continues to push for increased transistor density and better performance. But the pace of change is accelerating, making it harder for the entire ecosystem to keep up with those changes. In the past, major developments were roughly on an 18-month to 2-year cadence. Today, this is happening every few mon... » read more

Yield Management Embraces Expanding Role


Competitive pressures, shrinking time-to-market windows, and increased customization are collectively changing the dynamics and demands for yield management systems, shifting left from the fab to the design flow and right to assembly, packaging, and in-field analysis. The basic role of yield management systems is still expediting new product introductions, reducing scrap, and delivering grea... » read more

Preparing For The Multiphysics Future Of 3D ICs


3D integrated circuits (3D ICs) are emerging as a revolutionary approach to design, manufacturing and packaging in the semiconductor industry. Offering significant advantages in size, performance, power efficiency and cost, 3D ICs are poised to transform the landscape of electronic devices. However, with 3D ICs come new design and verification challenges that must be addressed to ensure success... » read more

Reliability On The Road: Multiphysics Design For Automotive 3D-ICs


Anyone who has purchased a car over the past decade knows that there has been a huge increase in the amount of compute processing involved in today’s modern automotive industry. Advanced chips for diagnostics and entertainment as well as logic associated with advanced sensor technology and automated assist features have quickly become key requirements that drivers rely on every day to ensure ... » read more

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