tag: Siemens EDA

New Materials Are in High Demand
By Bryon Moyer - 19 Sep, 2024 - Comments: 0

Materials suppliers are responding to the intense pressures to improve power, performance, scaling, and cost issues, which follows a long timeline from synthesis to development and high volume manufacturing in fabs. The advances in machine learning help present a wide field of candidates, which engineers then narrow to potential use. When building standard logic semiconductor chips, the prim... » read more

Blog Review: Sept. 18
By Jesse Allen - 18 Sep, 2024 - Comments: 0

Siemens’ Kyle Fraunfelter explores the similarities between hurricane forecasting and semiconductor manufacturing to argue for the value of integrating real-time wafer fabrication measurements into the digital twin models used to simulate the semiconductor fabrication process. Cadence’s Rohini Kollipara introduces Display Stream Compression (DSC), which can enable higher resolutions and ... » read more

CXL Thriving As Memory Link
By Karen Heyman - 16 Sep, 2024 - Comments: 0

CXL is emerging from a jumble of interconnect standards as a predictable way to connect memory to various processing elements, as well as to share memory resources within a data center. Compute Express Link is built on a PCI Express foundation and supported by nearly all the major chip companies. It is used to link CPUs, GPUs, FPGAs, and other purpose-built accelerators using serial communic... » read more

Elimination Of Functional False Path During RDC Analysis
By Farhad Ahmed - 12 Sep, 2024 - Comments: 0

Reset domain crossing (RDC) issues can occur in sequential designs when the reset of a source register differs from the reset of a destination register, even if the data path is in the same clock domain. This can lead to asynchronous crossing paths and metastability at the destination register. RDC analysis on RTL designs is done to find such metastability issues in a design, which may occur du... » read more

Is PPA Relevant Today?
By Brian Bailey - 12 Sep, 2024 - Comments: 0

The optimization of power, performance, and area (PPA) has been at the core of chip design since the dawn of EDA, but these metrics are becoming less valuable without the context of how and where these chips will be used. Unlike in the past, however, that context now comes from factors outside of hardware development. And while PPA still serves as a useful proxy for many parts of the hardwar... » read more

Higher Density, More Data Create New Bottlenecks In AI Chips
By Adam Kovac - 12 Sep, 2024 - Comments: 0

Data movement is becoming a bigger problem at advanced nodes and in advanced packaging due to denser circuitry, more physical effects that can affect the integrity of signals or the devices themselves, and a significant increase in data from AI and machine learning. Just shrinking features in a design is no longer sufficient, given the scaling mismatch between SRAM-based L1 cache and digital... » read more

On Analysis Of RDC Issues For Identifying Reset Tree Design Bugs And Further Strategies For Noise Reduction
By Siemens EDA - 12 Sep, 2024 - Comments: 0

Reset tree checks should be viewed thoroughly before reset domain crossing analysis. Static verification tools have many checks for reset tree analysis. This paper discusses the usage of non-resettable registers (NRRs) in reset paths. NRRs can cause metastability in the reset paths and hence thorough verification is a must. The paper discusses reduction of false failure reporting noise strategi... » read more

Blog Review: Sept. 11
By Jesse Allen - 11 Sep, 2024 - Comments: 0

Cadence's Neha Joshi introduces the IEEE 1801 standard, also known as UPF (Unified Power Format), which offers a uniform framework for defining power domains, power states, and power intent to ensure consistency across diverse tools and phases of the design process. Siemens' John McMillan warns that known good die may not behave the same in 3D-ICs as they do standalone and suggests that mult... » read more

Striking A Balance On Efficiency, Performance, And Cost
By Ed Sperling - 11 Sep, 2024 - Comments: 0

Experts at the Table: Semiconductor Engineering sat down to discuss power-related issues such as voltage droop, application-specific processing elements, the impact of physical effects in advanced packaging, and the benefits of backside power delivery, with Hans Yeager, senior principal engineer, architecture, at Tenstorrent; Joe Davis, senior director for Calibre interfaces and EM/IR product m... » read more

Standardizing Defect Coverage In Analog/Mixed Signal Test
By Gregory Haley - 10 Sep, 2024 - Comments: 0

A newly drafted IEEE standard will bring more consistency to defect metrics in analog/mixed (AMS) designs, a long-overdue step that has become too difficult to ignore in the costly heterogeneous assemblies being deployed inside of data centers and mobile devices. Standardizing analog is no simple feat due to the legacy approach to AMS design, and this is not the first attempt at improving te... » read more

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