tag: Siemens

Blog Review: March 18
By Jesse Allen - 18 Mar, 2020 - Comments: 0

Arm's Divya Prasad investigates whether power rails that are buried below the BEOL metal stack and back-side power delivery can help alleviate some of the major physical design challenges facing 3nm nodes and beyond. Rambus' Steven Woo takes a look at a Roofline model for analyzing machine learning applications that illustrates how AI applications perform on Google’s tensor processing unit... » read more

Aging Analysis Standard Solidifies Through Collaborative Effort
By Ahmed Ramadan - 12 Mar, 2020 - Comments: 0

By Ahmed Ramadan, Greg Curtis, Harrison Lee, Jongwook Kye, and Sorin Dobre We live in a connected world and it is estimated that by 20251 the total amount of worldwide data will swell to 163 ZB, or 163 trillion gigabytes. This rapid growth in data expansion is driving an explosion in new designs and new requirements for consumer, data center, automotive, and Internet of Things (IoT) applicat... » read more

The Long Road To Quantum Computing
By Susan Rambo - 12 Mar, 2020 - Comments: 0

Building a quantum computer is like building a cathedral. They both take a couple generations. The time frame for useful quantum computing applications that are not toy-sized is still a few years to a decade or more away. But the push is on now. Governments are racing to get their country’s quantum computing going for national security reasons. Companies such as Google and IBM are competin... » read more

Machine Learning At The Edge
By Mentor, a Siemens Business - 11 Mar, 2020 - Comments: 0

Moving machine learning to the edge has critical requirements on power and performance. Using off-the-shelf solutions is not practical. CPUs are too slow, GPUs/TPUs are expensive and consume too much power, and even generic machine learning accelerators can be overbuilt and are not optimal for power. In this paper, learn about creating new power/memory efficient hardware architectures to meet n... » read more

Test Costs Spiking
By Ed Sperling - 10 Mar, 2020 - Comments: 1

The cost of test is rising as a percentage of manufacturing costs, fueled by concerns about reliability of advanced-node designs in cars and data centers, as well as extended lifetimes for chips in those and other markets. For decades, test was limited to a flat 2% of total manufacturing cost, a formula developed prior to the turn of the Millennium after chipmakers and foundries saw the traj... » read more

Improving Functional Safety For ICs
By Mohammed Abdelwahid - 10 Mar, 2020 - Comments: 0

The exponential growth of electronics in automobiles have stimulated significant innovation towards the development of advanced safety mechanisms. In addition to very high-quality manufacturing test, ICs for safety-critical applications need in-system test to detect faults and monitor circuit aging. Scan-based logic built-in-self-test (LBIST) is the technique used for in-system test, but tradit... » read more

Grading Chips For Longer Lifetimes
By Ed Sperling - 10 Mar, 2020 - Comments: 0

Figuring out how to grade chips is becoming much more difficult as these chips are used in applications where they are supposed to last for decades rather than just a couple of years. During manufacturing, semiconductors typically are run through a battery of tests involving performance and power, and then priced accordingly. But that is no longer a straightforward process for several reason... » read more

AI Chip DFT Techniques For Aggressive Time-To-Market
By Mentor, a Siemens Business - 10 Mar, 2020 - Comments: 0

AI chips have aggressive time-to-market goals. Designers can shave significant time off of DFT and silicon bring up using the techniques described in this paper. Leading AI semiconductor companies have already had success with Tessent DFT tools. To read more, click here. » read more

Week In Review: Design, Low Power
By Jesse Allen - 06 Mar, 2020 - Comments: 0

Ansys will acquire Lumerical, a developer of photonic design and simulation tools. "The potential of photonics in applications like 5G, IIoT and autonomous vehicles can only be realized by solving immense multiphysics device and system challenges," said James Pond, co-CEO and CTO of Lumerical. "Together, Lumerical and Ansys are uniquely positioned to provide the necessary solutions, and custome... » read more

Automating Failure Mode Analysis For Automotive Safety
By Chuck Battikha - 05 Mar, 2020 - Comments: 0

By Chuck Battikha and Doug Smith If you’ve ever had to create a Failure Modes, Effects and Diagnostic Analysis (FMEDA), you know how difficult and painstaking a task it can be. But FMEDAs are essential in ensuring that your SoCs satisfy ISO 26262 functional safety analysis requirements for automotive designs and for demonstrating that your design is indeed safe. Because of the intens... » read more

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