tag: single event upsets

Early Cycle Analysis And Verification Of Logical SEU Mitigation
By Jacob Wiltgen - 04 Apr, 2024 - Comments: 0

The global appetite for data continues to soar, driving innovation across all industry sectors, including how space-based technology can facilitate a more connected world. Miniaturized satellites configured into constellations offer faster communication and higher bandwidth than lone satellites flying higher in geocentric or high-earth orbits. However, industry analysis suggests that to make... » read more

Designing Chips For Outer Space
By Ed Sperling - 08 Nov, 2023 - Comments: 0

If designing chips in cars sounds difficult, try designing them for space. There are huge temperature swings, and more radioactive particles than on Earth, which can cause single-event upsets, transients, functional interrupts, and latch-ups. A destructive latch-up can ruin a device, and in space that could transform an expensive piece of hardware into space junk. Ian Land, senior director for ... » read more

Radiation Tolerance Is Not Just For Rocket Scientists
By Synopsys - 23 Nov, 2022 - Comments: 0

As technology scales, soft errors from particle radiation are becoming increasingly concerning for in-field reliability. These radiation effects are called Single Event Upsets (SEU) and the frequency of the failures due to SEUs is known as the Soft Error Rate (SER). Soft errors are failures due to external sources. By contrast, hard errors refer to actual process manufacturing defects or electr... » read more

Medical, Industrial & Aerospace IC Design Changes
By Ann Mutschler - 30 Mar, 2020 - Comments: 0

Medical, industrial and aerospace chips are becoming much more complex as more intelligence is added into these devices, forcing design teams to begin leveraging tools and methodologies that typically have been used only at the leading-edge nodes for commercial applications. But as with automotive, the needs of these systems are changing quickly. In addition to strict quality, safety and sec... » read more

Chips In Space
By Ed Sperling - 01 Nov, 2018 - Comments: 0

Geoff Tate, CEO of Flex Logix, talks about why embedded FPGAs are being tapped for accelerators in satellites and airplanes, why programmability is so critical to deal with changes in technology that can span decades from initial design. https://youtu.be/ynZYKXcLCzE » read more

Why Auto Designs Take So Long
By Ann Mutschler - 02 Mar, 2017 - Comments: 0

Designing chips for the automotive market is adding significant overhead, particularly for chips with stringent safety requirements. On the verification side it could result in an additional 6 to 12 months of work. On the design side, developing the same processor in the mobile market would take 6 fewer man months. And when it comes to complex electronic control units (ECUs) or [getkc id="81... » read more

Fault Simulation Reborn
By Brian Bailey - 23 Feb, 2017 - Comments: 0

Fault simulation, one of the oldest tools in the EDA industry toolbox, is receiving a serious facelift after it almost faded from existence. In the early days, fault simulation was used to grade the quality of manufacturing test vectors. That task was replaced almost entirely by [getkc id="173" comment="scan test"] and automatic test pattern generation (ATPG). Today, functional safety is cau... » read more

How Reliable Is Your IP?
By Ed Sperling - 12 Sep, 2014 - Comments: 0

Almost everyone who has bought a new smartphone, car, home electronics device or appliance either has experienced technical glitches that require a replacement or repair, or they know someone who has experienced these problems. The good news is that only a very small fraction of the electronic glitches or failures can be contributed to hardware design. Most of it is due to manufacturing vari... » read more

Soft Errors Create Tough Problems
By Ed Sperling - 28 Apr, 2009 - Comments: 0

By Ed Sperling Single event upsets used to be as rare as some elements on the Periodic Table, with the damage they could cause relegated more to theory than reality. Not anymore. At 90nm, what was theory became reality. And at 45nm, the events are becoming far more common, often affecting multiple bits in increasingly dense arrays of memory and now, increasingly, in the logic. Known alter... » read more

  • Sponsors

About

Navigation

Connect With Us

Copyright ©2013-2024 SMG   |  Terms of Service  |  Privacy Policy