Taking Data Center Serviceability To The Next Level


It is no secret that Artificial Intelligence (AI) workloads are driving an exponential growth in the scale of supercomputers and data centers. Training the latest LLM (Large Language Model), for instance, typically requires thousands of specialized processing cores running at full speed. As these models get more advanced with each generation, they need additional compute performance to absorb a... » read more

Promises and Perils of Parallel Test


Testing multiple devices at the same time is not providing the equivalent reduction in overall test time due to a combination of test execution issues, the complexity of the devices being tested, and the complex tradeoffs required for parallelism. Parallel testing is now the norm — from full wafer probe DRAM testing with thousands of dies to two-site testing for complex, high-performance c... » read more

Standardizing Defect Coverage In Analog/Mixed Signal Test


A newly drafted IEEE standard will bring more consistency to defect metrics in analog/mixed (AMS) designs, a long-overdue step that has become too difficult to ignore in the costly heterogeneous assemblies being deployed inside of data centers and mobile devices. Standardizing analog is no simple feat due to the legacy approach to AMS design, and this is not the first attempt at improving te... » read more

Chip Industry Week In Review


Concerns mount on the use of American-manufactured semiconductors in Russian weapons, with Analog Devices, AMD, Intel and TI set to testify next week before the U.S. Senate Permanent Subcommittee on Investigations. Also, U.S. and other government agencies issued a joint advisory and more details about ongoing Russian military cyberattacks, espionage, and sabotage. The U.S. Commerce Departmen... » read more

Combining Silicon Data Capture And Edge Processing Offers A Promising Solution For Automotive OEMs


By Lorin Kennedy and Jasmin Mulaosmanovic In the world of electric (EV) and software-defined vehicles (SDV), a key challenge and opportunity besets original equipment manufacturers (OEM): that of effectively harnessing in-vehicle and silicon data to improve user experience and quite literally drive business benefits. While collecting telemetry data is straightforward enough, the difficulty l... » read more

Photonics Could Reduce The Cost Of Lidar


Using light to move data over shorter distances is becoming more common, both because there is much more data to move around and because photons are faster and cooler than electrons. Using optical fiber for mission-critical communication is already well established. It has been the preferred PHY for long-haul communications for decades because it doesn’t suffer from the attenuation losses ... » read more

Security Improving For Low-Cost Hardware


Security has been a priority in software for decades, but only recently has it begun catching up in chips — particularly those in inexpensive devices. The disconnect is that while these devices are low-cost, they often are connected to the same networks as more sophisticated devices and repositories for valuable data. It's not unusual for the entry point in ransomware or distributed denial... » read more

12 Levers to Elevate Your Software Testing


Software dominates automotive functions. Superior product and software quality are the key to high customer satisfaction, meeting safety requirements, and conquering tough timelines. The challenge is how to achieve maximum software quality without hiring an army of testers. This checklist describes 12 levers you can pull to help you build the most effective test team, while making your tes... » read more

Blog Review: Sept. 4


Synopsys' Jyotika Athavale and Randy Fish sit down with Google's Rama Govindaraju and Microsoft's Robert S. Chappell to discuss silent data corruption and why a solution will require chip designers and manufacturers, software and hardware engineers, vendors, and anyone involved in computer data to collaborate and take the issue seriously. Siemens' Karen Chow and Joel Mercier explain the rela... » read more

Chip Industry Technical Paper Roundup: Sept. 3


New technical papers recently added to Semiconductor Engineering’s library: [table id=256 /] More ReadingTechnical Paper Library home » read more

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