tag: Synopsys

Blog Review: Apr. 30
By Jesse Allen - 30 Apr, 2025 - Comments: 0

Cadence’s Sree Parvathy points out how electrothermal analysis can help designers understand how temperature changes affect device behavior, such as mobility, threshold voltage, and saturation to mitigate potential failures due to thermal overstress. In a podcast, Siemens’ Conor Peick, Dale Tutt, and Mike Ellow chat about the transition towards software-defined products and why companies... » read more

Security Power Requirements Are Growing
By Adam Kovac - 28 Apr, 2025 - Comments: 0

Determining how much power to budget for security in a chip design is a complex calculation. It starts with a risk assessment of the cost of a breach and the number of possible attack vectors, and whether security is active or passive. Different forms of root of trust and cryptography have different power costs. Different systems could require tradeoffs between performance and security, whic... » read more

Chip Industry Week in Review
By The SE Staff - 25 Apr, 2025 - Comments: 0

To listen to the podcast version, click here. TSMC unveiled an unusually detailed roadmap at this week's North America Technology Symposium, including future architectures for 3D-ICs for high-performance computing and small, extremely low-power chips for AR/VR glasses, and two implementations of system-on-wafer. Fig. 1: TSMC's future packaging and stacking roadmap. Source: TSMC The ... » read more

AI Drives Re-Engineering Of Nearly Everything In Chips
By Ed Sperling - 24 Apr, 2025 - Comments: 0

AI's ability to mine patterns across massive quantities of data is causing fundamental changes in how chips are used, how they are designed, and how they are packaged and built. These shifts are especially apparent in high-performance AI architectures being used inside of large data centers, where chiplets are being deployed to process, move, and store massive amounts of data. But they also ... » read more

AI-Driven Verification Regression Management
By Paul Carzola - 24 Apr, 2025 - Comments: 0

By Paul Carzola and Taruna Reddy Coping with the endless growth in chip size and complexity requires innovative electronic design automation (EDA) solutions at every stage of the development process. Better algorithms, increased parallelism, higher levels of abstraction, execution on graphics processing units (GPUs), and use of AI and machine learning (ML) all contribute to these solutions. ... » read more

New Ways To Improve EDA Productivity
By Ann Mutschler - 24 Apr, 2025 - Comments: 0

EDA vendors are taking aim at new ways to improve the productivity of design and verification engineers, who are struggling to keep pace with exponential increases in chip complexity in tight time-to-market windows and with constrained engineering talent pipelines. In the past, progress often was as straightforward as improving algorithms or parallelizing computations in a linear flow. But w... » read more

Analog Creates Ripples in Digital Verification
By Brian Bailey - 24 Apr, 2025 - Comments: 0

We live in an analog world, but analog has been minimized whenever possible. At some point digital and analog must come together in every electronic device, and that has long been an area where errors creep in. The Wilson Research Group and Siemens EDA functional verification study has long shown that analog and mixed signal are two of the highest causes of flaws that result in chip respins.... » read more

Multi-Die Design Start Guide
By Synopsys - 23 Apr, 2025 - Comments: 0

If you are exploring a multi-die project and need guidelines on getting started, this white paper is for you. Any engineer on a semiconductor design project has read many articles about the power, performance, and area (PPA), functional scalability, and time-to-market advantages of multi-die designs using 2.5D and 3D technologies. The advantages are the main reason the adoption of multi-die des... » read more

Need For Speed Drives Targeted Testing
By Gregory Haley - 23 Apr, 2025 - Comments: 0

As packaging complexity increases and nodes shrink, defect detection becomes significantly more difficult. Engineers must contend with subtle variations introduced during fabrication and assembly without sacrificing throughput. New material stacks degrade signal-to-noise ratios, which makes metrology more difficult. At the same time, inspection systems face a more nuanced challenge — how t... » read more

Secure Handling Of Financial Data In Manufacturing
By Anne Meixner - 21 Apr, 2025 - Comments: 0

Experts at the Table: Semiconductor Engineering sat down to discuss the advantages associated with linking financial data with manufacturing data analytic platforms, real security challenges and the best uses for AI/ML methods, with Dieter Rathei, CEO of DR Yield; Jon Holt, senior director of product management at PDF Solutions, Alex Burlak, vice president of advanced analytics and test at p... » read more

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