DRAM Choices Are Suddenly Much More Complicated


Chipmakers are beginning to incorporate multiple types and flavors of DRAM in the same advanced package, setting the stage for increasingly distributed memory but significantly more complex designs. Despite years of predictions that DRAM would be replaced by other types of memory, it remains an essential component in nearly all computing. Rather than fading away, its footprint is increasing,... » read more

Chip Industry Week In Review


By Jesse Allen, Gregory Haley, and Liz Allan Bosch, Infineon, and NXP were cleared in Germany to each acquire 10% of the European Semiconductor Manufacturing Co. (ESMC), established by TSMC, solidifying the supply chain against future shortages, particularly for automotive chips. “ESMC intends to build and operate another large semiconductor factory in Dresden, in which the three Europ... » read more

Flipping Processor Design On Its Head


AI is changing processor design in fundamental ways, combining customized processing elements for specific AI workloads with more traditional processors for other tasks. But the tradeoffs are increasingly confusing, complex, and challenging to manage. For example, workloads can change faster than the time it takes to churn out customized designs. In addition, the AI-specific processes may ex... » read more

An Entangled Heterarchy


For decades, a form of structural hierarchy has been the principal means of handling complexity in chip design. It's not always perfect, and there is no ideal way in which to divide and conquer because that would need to focus on the analysis being performed. In fact, most systems can be viewed from a variety of different hierarchies, equally correct, and together forming a heterarchy. The e... » read more

Designing Chips For Outer Space


If designing chips in cars sounds difficult, try designing them for space. There are huge temperature swings, and more radioactive particles than on Earth, which can cause single-event upsets, transients, functional interrupts, and latch-ups. A destructive latch-up can ruin a device, and in space that could transform an expensive piece of hardware into space junk. Ian Land, senior director for ... » read more

Startup Funding: October 2023


Investors are betting heavily on data center technology, with October funding going to companies developing data processing units (DPUs) to accelerate a variety of tasks, a near-memory distributed dataflow architecture for AI, and liquid cooling technology. Much of this is linked to the build-out of the edge, closer to the source of the data than the cloud but not as compute-intensive. Other ... » read more

Blog Review: Nov. 8


Siemens' Todd Westerhoff takes a look at the three stages of power integrity analysis for PCBs, challenges to board-level signal integrity, and best practices for getting the most accurate estimate of design performance. Synopsys' William Ruby provides a brief overview of the evolution of low-power design techniques and finds opportunities to reduce power and to make chip designs more energy... » read more

New Insights Into IC Process Defectivity


Finding critical defects in manufacturing is becoming more difficult due to tighter design margins, new processes, and shorter process windows. Process marginality and parametric outliers used to be problematic at each new node, but now they are persistent problems at several nodes and in advanced packaging, where there may be a mix of different technologies. In addition, there are more proc... » read more

DRAM Test And Inspection Just Gets Tougher


DRAM manufacturers continue to demand cost-effective solutions for screening and process improvement amid growing concerns over defects and process variability, but meeting that demand is becoming much more difficult with the rollout of faster interfaces and multi-chip packages. DRAM plays a key role in a wide variety of electronic devices, from phones and PCs to ECUs in cars and servers ins... » read more

Rebalancing Test And Yield In IC Manufacturing


Balancing yield and test is essential to semiconductor manufacturing, but it's becoming harder to determine how much weight to give one versus the other as chips become more specialized for different applications. Yield focuses on maximizing the number of functional chips from a production batch, while test aims to ensure that each chip meets rigorous quality and performance standards. And w... » read more

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