Week In Review: Auto, Security, Pervasive Computing


Public USB phone charging stations are now another vector that bad actors can use to plant malware and steal data on devices — known as "juice jacking," according to the United States’ Federal Communications Commission (FCC). The FCC is encouraging people to stay away from these public charging stations, found in airports and hotels, because of bad actors can install malware on the charging... » read more

Thermal Integrity Challenges Grow In 2.5D


Thermal integrity is becoming much harder to predict accurately in 2.5D and 3D-IC, creating a cascade of issues that can affect everything from how a system behaves to reliability in the field. Over the past decade, silicon interposer technology has evolved from a simple interconnect into a critical enabler for heterogeneous integration. Interposers today may contain tens of dies or chiplets... » read more

What Designers Need To Know About GAA


While only 12 years old, finFETs are reaching the end of the line. They are being supplanted by gate-all-around (GAA), starting at 3nm [1], which is expected to have a significant impact on how chips are designed. GAAs come in two main flavors today — nanosheets and nanowires. There is much confusion about nanosheets, and the difference between nanosheets and nanowires. The industry still ... » read more

Transitioning To Photonics


Silicon photonics is undergoing a resurgence as traditional approaches for reducing power and heat become more difficult and expensive, opening the door to a whole new set of technological challenges and driving up demand for a skill set that is in short supply today. From a technology standpoint, photonics is extremely complex. Signals drift, they are modulated with heat, and structures lik... » read more

How eMRAM Addresses The Power Dilemma In Advanced-Node SoCs


By Rahul Thukral and Bhavana Chaurasia Our intelligent, interconnected, data-driven world demands more computation and capacity. Consider the variety of smart applications we now have. Cars can transport passengers to their destinations using local and remote AI decision-making. Robot vacuum cleaners keep our homes tidy, and smartwatches can detect a fall and call emergency services. With hi... » read more

RISC-V Driving New Verification Concepts


Semiconductor Engineering sat down to discuss gaps in tools and why new methodologies are needed for RISC-V processors, with Pete Hardee, group director for product management at Cadence; Mike Eftimakis, vice president for strategy and ecosystem at Codasip; Simon Davidmann, founder and CEO of Imperas Software; Sven Beyer, program manager for processor verification at Siemens EDA; Kiran Vittal, ... » read more

Blog Review: April 12


Cadence's Ericles Sousa describes the five critical features of automotive SoC architectures that are essential for developing the next generation of passenger vehicles. In a podcast, Siemens' Steph Chavez chats with Gerry Partida of Summit Interconnect about the difficulties in collaboration between PCB designers and manufacturers, along with best practices that designers should follow to r... » read more

What Data Center Chipmakers Can Learn From Automotive


Automotive OEMs are demanding their semiconductor suppliers achieve a nearly unmeasurable target of 10 defective parts per billion (DPPB). Whether this is realistic remains to be seen, but systems companies are looking to emulate that level of quality for their data center SoCs. Building to that quality level is more expensive up front, although ultimately it can save costs versus having to ... » read more

Challenges In Photonics Testing


Photonics is poised for significant growth due a rapid increase in data volumes and the need to move that data quickly and with minimal heat. But to reach its full potential photonics will have to overcome several production hurdles. The biggest challenge today involves alignment. While the industry is poised to produce billions of units, it still relies on testing practices that don't scale. ... » read more

Power-Aware Test: Beyond Low-Power Test


By Rahul Singhal and Likith Kumar Manchukonda Power consumption is one of the key considerations when designing today’s semiconductor chips and systems. Over the years, the constant need for higher performance and more functions from the chips has been driving the continuous requirement for higher transistor density. The process node scaling makes this possible by reducing transistor sizes... » read more

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