tag: telemetry

A Bench-To-In-Field Telemetry Platform For Data Center Power Management
By Aakash Jani - 28 May, 2026 - Comments: 0

By Aakash Jani and Venkatesh Santhanagopalan NVIDIA's Blackwell platform delivered roughly 15% lower energy and 13% higher throughput [1]. Those gains came from hardware-firmware co-design that matches operating points to each workload, not a new process node. Most SoCs do not adapt: their margins are set and frozen the day silicon ships, based on the workloads measured at the bench. The mi... » read more

New Automotive Architectures Are Shaking Up Processor And Memory Choices
By Ann Mutschler - 05 Mar, 2026 - Comments: 0

Key Takeaways Assisted and autonomous driving require more data from more sensors, and much faster processing of some of that data. The shift to software-defined vehicles and centralized intelligence makes it easier to identify where the most advanced processors and memories are required, and where older and less expensive technologies can be deployed. Technologies that were largely ... » read more

Maximize Uptime And Improve TCO: RAS And Telemetry In HBM4 For Data Centers
By Raj Uppala - 14 Aug, 2025 - Comments: 0

As AI workloads scale and data center operations become increasingly complex, it is critical to keep the infrastructure up and running. Total Cost of Ownership (TCO) is a key metric that includes not only the upfront cost of hardware but also the ongoing expenses of power, cooling, maintenance, and—most importantly—downtime. A single memory failure in a hyperscale AI cluster can cascade int... » read more

SoC Power Delivery Network (PDN) Telemetry And Applications
By Movellus - 28 May, 2025 - Comments: 0

PDN characterization needs visibility at the transistor. Through this white paper, we will learn why PDN visibility is crucial to each stage of the silicon lifecycle and its relation to power, performance, and in-field uptime. Register here to download the paper. » read more

Combining Silicon Data Capture And Edge Processing Offers A Promising Solution For Automotive OEMs
By Lorin Kennedy - 05 Sep, 2024 - Comments: 0

By Lorin Kennedy and Jasmin Mulaosmanovic In the world of electric (EV) and software-defined vehicles (SDV), a key challenge and opportunity besets original equipment manufacturers (OEM): that of effectively harnessing in-vehicle and silicon data to improve user experience and quite literally drive business benefits. While collecting telemetry data is straightforward enough, the difficulty l... » read more

SoC Telemetry & Performance Analysis Using Statistical Profiling Extension
By Brian Jeff - 11 Jan, 2024 - Comments: 0

The Arm Statistical Profiling Extension (SPE) is an architectural feature designed for enhanced instruction execution profiling within Arm CPUs. This feature has been available since the introduction of the Neoverse N1 CPU platform in 2019, along with performance monitor units (PMUs) generally available in Arm CPUs. An important step in extracting value from capabilities like SPE and PMUs is th... » read more

Plugging Gaps In The IC Supply Chain
By Anne Meixner - 09 Jan, 2024 - Comments: 0

Multiple touch points in manufacturing and packaging are exposing gaps in the data used to track different components, making it difficult to identify the source of issues that can affect yield and reliability, and opening the door to counterfeit or sub-standard parts. This involves more than just assigning a simple identifying code to a chip. At different points in a device's lifecycle, new... » read more

Improving Reliability In Chips
By Anne Meixner - 12 Sep, 2023 - Comments: 1

Semiconductor Engineering sat down to discuss changes in test that address tracing device quality throughout a product’s lifetime with Tom Katsioulas, CEO at Archon Design Solutions and U.S. Department of Commerce IoT advisory board member; Ming Zhang, vice president of R&D Acceleration at PDF Solutions; and Uzi Baruch, chief strategy officer at proteanTecs. What follows are excerpts of t... » read more

Pinpointing Timing Delays in Complex SoCs
By Anne Meixner - 11 Jul, 2023 - Comments: 0

Telemetry circuits are becoming a necessity in complex heterogeneous chips and packages to show how these devices are behaving post-production, but fusing together relevant data to identify the sources of problems adds its own set of challenges. In the past, engineering teams could build margin into chips to offset any type of variation. But at advanced nodes and in advanced packages, tolera... » read more

Test Challenges Mount As Demands For Reliability Increase
By Anne Meixner - 07 Mar, 2023 - Comments: 0

An emphasis of improving semiconductor quality is beginning to spread well beyond just data centers and automotive applications, where ICs play a role in mission- and safety-critical applications. But this focus on improved reliability is ratcheting up pressure throughout the test community, from lab to fab and into the field, in products where transistor density continues to grow — and wh... » read more

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