tag: test

Industrial Solutions For Machine-Learning-Enabled Yield Optimization And Test
By Sonny Banwari - 10 Jan, 2023 - Comments: 0

This article summarizes the content of a paper developed and presented by Advantest at ETS 2022. By Sonny Banwari and Matthias Sauer According to market research firm Gartner, Inc., in assessing the completion rate of data science projects, as well as the bottom-line value they generate for their companies, only between 15 and 20 percent of these projects are ever completed. Moreover, of ... » read more

Silent Data Corruption
By Ed Sperling - 12 Dec, 2022 - Comments: 0

Defects can creep into chip manufacturing from anywhere, but the problem is getting worse at advanced nodes and in advanced packages where reduced pin access can make testing much more difficult. Ira Leventhal, vice president of U.S. Applied Research and Technology at Advantest America, talks about what’s causing these so-called silent data errors, how to find them, and why it now requires ma... » read more

Packetized Scan Test
By Siemens EDA - 06 Dec, 2022 - Comments: 0

Bus-based packetized scan data decouples test delivery and core-level DFT requirements so core-level compression configuration can be defined completely independently of chip I/O limitations. Grouping cores for concurrent testing is selected programmatically, not hard-wired. This concept dramatically reduces the DFT planning and implementation effort. The Siemens solution for packetized deli... » read more

Improving Concurrent Chip Design, Manufacturing, And Test Flows
By Ann Mutschler - 28 Nov, 2022 - Comments: 0

Semiconductor design, manufacturing, and test are becoming much more tightly integrated as the chip industry seeks to optimize designs using fewer engineers, setting the stage for greater efficiencies and potentially lower chip costs without just relying on economies of scale. The glue between these various processes is data, and the chip industry is working to weave together various steps t... » read more

Simplifying The Path From Design To Test
By Richard Fanning - 08 Nov, 2022 - Comments: 0

By Richard Fanning and John Rowe Getting an integrated circuit (IC) from design to test is an arduous process that encompasses a number of steps, including: Design for Test (DFT): processes that ensure the chip is designed in such a way that it can be tested Development: the development of automated test programs (ATPs) Bench: evaluating the device at the bench to ensure the desig... » read more

Expansion Of The IoT Brings New Security Challenges
By Synopsys - 02 Nov, 2022 - Comments: 0

The evolution of 5G technologies continues to drive advancement in Internet of Things (IoT) devices and their applications. By 2025, experts predict there will be nearly 4 billion IoT mobile connections in the world, and more than 64 billion IoT devices by 2026. In addition to enabling superior performance and efficiency, 5G expands the attack surface of applications and devices that run on ... » read more

Production Testing Of Discrete Power Products
By Vineet Pancholi - 20 Oct, 2022 - Comments: 0

By Vineet Pancholi and Dennis Dinawanao Metal Oxide Silicon Field Effect Transistors (MOSFETs), Insulated Gate Bipolar Transistors (IGBTs), Bipolar Junction Transistors (BJTs), diodes, and application specific multi-transistor packaged modules are some of the more popular discrete products. Switches control the flow of current within a circuit. MOSFETs are a building block of most electronic... » read more

Yield Is Top Issue For MicroLEDs
By Laura Peters - 11 Oct, 2022 - Comments: 0

MicroLED display makers are marching toward commercialization, with products such as Samsung’s The Wall TV and Apple’s smart watch expected to be in volume production next year or in 2024. These tiny illuminators are the hot new technology in the display world, enabling higher pixel density, better contrast, lower power consumption, and higher luminance in direct sunlight — while consu... » read more

The Future Of Connectivity Is Higher Data Rates And Micro-Positioning
By David Vondran - 11 Oct, 2022 - Comments: 0

These days, we tend to take global wireless connectivity for granted. Whether we’re in a coffee shop, a hotel room, or a plane at 35,000 feet, chances are that we’ll be able to enjoy Internet access at reasonable speeds. But despite this constant connectedness, we still manage to misplace our keys and forget where we left our smartphones. New connectivity technologies are promising to ha... » read more

Week In Review: Manufacturing, Test
By Karen Heyman and Anne Meixner - 30 Sep, 2022 - Comments: 0

Highlights from ITC The hot topic at this week’s International Test Conference (ITC) was tackling silent data corruption, with panel discussions, papers, and Google’s Parthasarathy Ranganathan’s keynote address all emphasizing the urgency of the issue. In the past two years Meta, Google, and Microsoft have reported on silent errors, errors not detected at test, which are adversely impact... » read more

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