tag: testing

Automakers Take On More Responsibility
By Kevin Fogarty - 08 Oct, 2018 - Comments: 0

Chip and EDA companies are scrambling to deal with stiff safety regulations and harsh environmental conditions for automotive chips, but automakers are making big changes of their own to ensure all those components work together as expected. The result is a significant shift of responsibilities of companies in the automotive supply chain. Carmakers traditionally have left verification, valid... » read more

Adaptive Test With Test Escape Estimation for Mixed-Signal ICs
By Technical Paper Link - 31 Dec, 2017 - Comments: 0

Abstract: The standard approach in industry for post-manufacturing testing of mixed-signal circuits is to measure the performances that are included in the data sheet. Despite being accurate and straightforward, this approach involves a high test time since there are numerous performances that need to be measured sequentially by switching the circuit into different test configurations. Adapt... » read more

Finally, Realizing The Full Benefits Of Parallel Site-To-Site (S2S) Testing
By Guy Cortez - 08 May, 2017 - Comments: 0

A very common and well-known practice by manufacturers during the IC test process is to test as many of the device die or packaged parts as possible in parallel (i.e. sites) during wafer sort and final test in order to increase test time efficiency and lower overall test costs. The constraints that typically restrict how many test sites can be used at any given time are the design I/O and capac... » read more

Building Secure Software At Enterprise Scale
By Synopsys - 12 Apr, 2017 - Comments: 0

The cost of finding and remediating a software defect reduces dramatically the earlier it is found in the development life cycle. This is not new news. What is new news is an approach that builds security into the development process in a way that is easy for developers to adopt, without slowing down their workflow. Download the paper to learn how you can: Prevent common bugs and flaw... » read more

Looking Back at Board Test
By Jeff Dorsch - 10 Apr, 2017 - Comments: 0

Printed circuit board testing has been around as long as printed circuit boards, also known as printed circuit assemblies and printed wiring boards. PCB technology started in the early 20th century with Thomas Edison and other inventors. As boards shrink to fit inside wearable gadgets and other products with compact form factors, PCB test equipment vendors are addressing new challenges. Boar... » read more

What we know after twelve years developing and deploying test data analytics solutions
By Technical Paper Link - 31 Dec, 2016 - Comments: 0

Abstract: Since 2004, Texas Instruments and Portland State University have collaborated to develop and deploy test data analytical methods for use in a variety of applications, including quality screening, burn-in minimization, high cost test replacement and/or removal, and operations monitoring. In this paper, key findings amassed during this time are summarized. Find the technical paper h... » read more

The Trust Burning Debug Cycle From Hell
By Neil Johnson - 03 Oct, 2016 - Comments: 3

As bad as The Trust Burning Debug Cycle From Hell sounds, it’s worse than you think. Most of us don’t realize it exists. In my first 10 years as a hardware developer I wrote code like it could never exist! But then came the realization. It’s a cycle that preys on us all. It tempts me constantly. Most of us in hardware development are used to seeing bugs as annoyances at a minimum, thou... » read more

IGBT Power Cycling And Lifetime Testing
By Mathew Clark - 15 Jan, 2015 - Comments: 0

I have never been very good at introducing topics. During my presentations, I either jump directly into the subject matter, or start with a joke. My mom always said I could be a stand-up comedian. I prefer to sit. Oddly, that led me to becoming an engineer. And while this introduction does not lead me any closer to my actual topic, I presume some people rolled their eyes back and crossed their ... » read more

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