Shrinking AV’s 1 Billion Test Miles


There is still no answer to how many miles an autonomous vehicle needs to drive before it's proven safe. But some AV developers and test companies are hoping to ease the burden a bit with automation that makes millions of real and simulated miles of road testing simpler to implement, supported by standards that make it easier to create and trade simulation scenarios. The goal is to reduce th... » read more

Design, System Integration and Testing of Radar Systems


This article discusses some of the fundamental research and development challenges in both the digital and RF/millimeter wave domains (such as waveform generation, receiver algorithms and transmit/receive front ends) and addresses current and future directions in design, system integration and test. Radar applications are becoming more diverse and commercialization is accelerating due to sig... » read more

What is STS Software Bundle?


The STS Software Bundle provides all the software tools and hardware drivers you need to efficiently develop and deploy test programs, interactively debug, and maintain and calibrate the NI Semiconductor Test System (STS). NI will release new bundles regularly to incorporate new functionality and hardware drivers. The STS Software Bundle includes tools for interactive measurements and debugg... » read more

Automakers Take On More Responsibility


Chip and EDA companies are scrambling to deal with stiff safety regulations and harsh environmental conditions for automotive chips, but automakers are making big changes of their own to ensure all those components work together as expected. The result is a significant shift of responsibilities of companies in the automotive supply chain. Carmakers traditionally have left verification, valid... » read more

Finally, Realizing The Full Benefits Of Parallel Site-To-Site (S2S) Testing


A very common and well-known practice by manufacturers during the IC test process is to test as many of the device die or packaged parts as possible in parallel (i.e. sites) during wafer sort and final test in order to increase test time efficiency and lower overall test costs. The constraints that typically restrict how many test sites can be used at any given time are the design I/O and capac... » read more

Building Secure Software At Enterprise Scale


The cost of finding and remediating a software defect reduces dramatically the earlier it is found in the development life cycle. This is not new news. What is new news is an approach that builds security into the development process in a way that is easy for developers to adopt, without slowing down their workflow. Download the paper to learn how you can: Prevent common bugs and flaw... » read more

Looking Back at Board Test


Printed circuit board testing has been around as long as printed circuit boards, also known as printed circuit assemblies and printed wiring boards. PCB technology started in the early 20th century with Thomas Edison and other inventors. As boards shrink to fit inside wearable gadgets and other products with compact form factors, PCB test equipment vendors are addressing new challenges. Boar... » read more

The Trust Burning Debug Cycle From Hell


As bad as The Trust Burning Debug Cycle From Hell sounds, it’s worse than you think. Most of us don’t realize it exists. In my first 10 years as a hardware developer I wrote code like it could never exist! But then came the realization. It’s a cycle that preys on us all. It tempts me constantly. Most of us in hardware development are used to seeing bugs as annoyances at a minimum, thou... » read more

IGBT Power Cycling And Lifetime Testing


I have never been very good at introducing topics. During my presentations, I either jump directly into the subject matter, or start with a joke. My mom always said I could be a stand-up comedian. I prefer to sit. Oddly, that led me to becoming an engineer. And while this introduction does not lead me any closer to my actual topic, I presume some people rolled their eyes back and crossed their ... » read more