Toshiba Verifies Thermal Contribution In Motor Control Driver ICs


High output current ICs usually generate a lot of heat from the driver transistor, which affects the surrounding circuits. Therefore, it is important to take into account the transient heat based on the output current level when designing applications such as engine throttles or on/off switches for engine bulbs. In this whitepaper, the Toshiba team discusses how they used the Eldo circuit simul... » read more

Latency Under Load: HBM2 vs. GDDR6


Steven Woo, Rambus fellow and distinguished inventor, explains why data traffic and bandwidth are critical to choosing the type of DRAM, options for improving traffic flow in different memory types, and how this works with multiple memory types.   Related Video GDDR6 - HBM2 Tradeoffs Why designers choose one memory type over another. Applications for each were clearly delineate... » read more

New Challenges For Data Centers


Rita Horner, senior technical marketing manager in Synopsys’ Solutions Group, looks at the impact of a significant rise in data, why this often leads to big cost increases, and where the bottlenecks are occurring. » read more

2.5D, 3D Power Integrity


Chris Ortiz, principal applications engineer at ANSYS, zeroes in on some common issues that are showing up in 2.5D and 3D packaging, which were not obvious in the initial implementations of these packaging technologies. This includes everything from how to build a power delivery network to minimize the coupling between chips to dealing with variability and power integrity and placement of diffe... » read more

Mapping The Impact Of Heat On Photonics


Heat and various types of noise can disrupt optical signals in silicon photonics applications, pushing light into frequencies that generally are filtered out. Unless those filters are adjusted, data may be lost or incomplete, and in the case of streaming data it may be impossible to reconstruct. But predicting when and how physical effects will affect light isn't always obvious, which makes ... » read more

Planarization Challenges At 7nm And Beyond


Dan Sullivan, executive director of semiconductor technology at Brewer Science, digs into the challenges of planarizing a thin film on a wafer for etch and optical control. The problem becomes more difficult at advanced nodes because the films are thinner. https://youtu.be/iNA6EGpoYZU     _________________________________ See more tech talk videos here   » read more

Manufacturing Bits: May 29


Utilizing Heat For Energy One of the big problems in electronics in general, and semiconductors particular, is heat. And it's not just about leakage current anymore. Heat is a problem at every level, from circuit design to the materials being used inside the chips, as well as warpage between die caused by heat after they are packaged together. Heat can prematurely age chips as well as destroy ... » read more

Early Chip-Package-System Thermal Analysis


Next-generation automotive, HPC and networking applications are pushing the requirements of thermal integrity and reliability, as they need to operate in extreme conditions for extended periods of time. FinFET designs have high dynamic power density, and power directly impacts the thermal signature of the chip. Thermal degradation typically occurs over an extended period of chip operation. ... » read more

Tech Talk: 5/3nm Parasitics


Ralph Iverson, principal R&D engineer at Synopsys, talks about parasitic extraction at 5/3nm and what to expect with new materials and gate structures such as gate-all-around FETs and vertical nanowire FETs. https://youtu.be/24C6byQBkuI » read more

New Thermal Issues Emerge


Thermal monitoring is becoming more critical as gate density continues to increase at each new node and as chips are developed for safety critical markets such as automotive. This may sound counterintuitive because the whole point of device scaling is to increase gate density. But at 10/7 and 7/5nm, static current leakage is becoming a bigger issue, raising questions about how long [getkc id... » read more

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