tag: voltage drop

Voltage Drop Now Requires Dynamic Analysis
By Karen Heyman - 08 Aug, 2024 - Comments: 0

At one time a relatively infrequent occurrence, voltage drop is now a major impediment to reliability at advanced nodes. Decades ago, voltage drop was only an issue for very large and high-speed designs, where there was concern about supply lines delivering full voltage to transistors. As design margins have tightened in modern advanced designs, controlling voltage drop has become a requiremen... » read more

ML Method To Predict IR Drop Levels
By Technical Paper Link - 21 Jun, 2024 - Comments: 0

A new technical paper titled "IR drop Prediction Based on Machine Learning and Pattern Reduction" was published by researchers at National Tsing Hua University, National Taiwan University of Science and Technology, and MediaTek. Abstract (partial) "In this paper, we propose a machine learning-based method to predict IR drop levels and present an algorithm for reducing simulation patterns, w... » read more

Using AI/ML To Minimize IR Drop
By Ann Mutschler - 11 Apr, 2024 - Comments: 1

IR drop is becoming a much bigger problem as technology nodes scale and more components are packed into advanced packages. This is partly a result of physics, but it's also the result of how the design flow is structured. In most cases, AI/ML can help. The underlying problem is that moving to advanced process nodes, and now 3D-ICs, is driving current densities higher, while the power envelop... » read more

Next-Gen Power Integrity Challenges
By Ed Sperling - 14 Dec, 2023 - Comments: 0

Experts at the Table: Semiconductor Engineering sat down to discuss power integrity challenges and best practices in designs at 7nm and below, and in 2.5D and 3D-IC packages, with Chip Stratakos, partner, physical design at Microsoft; Mohit Jain, principal engineer at Qualcomm; Thomas Quan, director at TSMC; and Murat Becer, vice president at Ansys. What follows are excerpts of that conversatio... » read more

Taming Corner Explosion In Complex Chips
By Brian Bailey - 23 Feb, 2023 - Comments: 0

There is a tenuous balance between the number of corners a design team must consider, the cost of analysis, and the margins they insert to deal with them, but that tradeoff is becoming a lot more difficult. If too many corners of a chip are explored, it might never see production. If not enough corners are explored, it could reduce yield. And if too much margin is added, the device may not be c... » read more

On-Chip Power Distribution Modeling Becomes Essential Below 7nm
By Ann Mutschler - 16 Nov, 2022 - Comments: 0

Modeling power distribution in SoCs is becoming increasingly important at each new node and in 3D-ICs, where tolerances involving power are much tighter and any mistake can cause functional failures. At mature nodes, where there is more metal, power problems continue to be rare. But at advanced nodes, where chips are running at higher frequencies and still consuming the same or greater power... » read more

Minimizing EM/IR Impacts On IC Design Reliability And Performance
By Joel Mercier - 13 Sep, 2022 - Comments: 0

By Joel Mercier and Karen Chow As technologies and foundry process nodes continue to advance, it gets more difficult to design and verify integrated circuits (ICs). The challenges become even more apparent in 5nm and below nodes, and as the industry moves away from fin field-effect transistor (finFET) and into gate-all-around field-effect transistor (GAAFET) technologies. There are many prob... » read more

Overcoming The Growing Challenge Of Dynamic IR-Drop
By PV Srinivas - 24 Mar, 2022 - Comments: 0

IR-drop has always been somewhat of an issue in chip design; voltage decreases as current travels along any path with any resistance. Ohm’s Law is likely the first thing that every electrical engineer learns. But the challenges related to IR-drop (sometimes called voltage drop) have increased considerably in recent years, especially the dynamic IR-drop in the power/ground grid as circuits swi... » read more

Is Common Resistance Affecting Your Analog Design Reliability And Performance?
By Hossam Sarhan - 11 Jun, 2020 - Comments: 0

Integrated circuit (IC) design reliability has always been important and essential to market success. After all, if no one could count on your product to operate as designed, and for as long as intended, there wouldn’t be many buyers! However, given the increase in the types and complexity of design applications, coupled with the increasing technological challenge of manufacturing at advance... » read more

Why Chips Die
By Brian Bailey - 12 Nov, 2018 - Comments: 4

Semiconductor devices contain hundreds of millions of transistors operating at extreme temperatures and in hostile environments, so it should come as no surprise that many of these devices fail to operate as expected or have a finite lifetime. Some devices never make it out of the lab and many others die in the fab. It is hoped that most devices released into products will survive until they be... » read more

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