Is Product Quality Getting Lost In The IIoT?


Manufacturing operations have continuously evolved using data capture and management to assess and test production effectiveness on the manufacturing floor. The advent of the Industrial Internet of Things (IIoT) and its anticipated ability to track and manage the factory environment with machine-to-machine process analytics heralds yet another transformation, promising a higher level of data in... » read more

Addressing Test Time Challenges


Unit test time on automated test equipment (ATE) is one of the major components that affects the total cost of manufacturing for semiconductor suppliers. The test programs for each unit can be comprised of thousands of parametric and functional tests that are performed to screen out defective units or dies. However, tester time is expensive, so suppliers are always looking for ways to reduce th... » read more