How functional safety analysis can be used to achieve a careful tradeoff of several metrics for efficient use of safety mechanisms.
Functional safety requirements for safety-critical applications are addressed with the insertion of safety mechanisms to detect and/or correct potential failures: their effectiveness is measured by diagnostic coverage (DC). Built-in-self-test, or BIST, originally developed for manufacturing test, can be used as a detection mechanism for functional safety. However, it requires original values to be restored and execution time to fit within the required diagnostic time. Here, we introduce how functional safety analysis can be used to achieve a careful tradeoff of several metrics for efficient use of safety mechanisms. Online/offline logic BIST (LBIST) solutions on single- and multicore architectures based on a vision-processing core are analyzed in the context of functional safety and compared to other safety mechanisms to address permanent and transient faults.
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