Co-Design View of Cross-Bar Based Compute-In-Memory
By Technical Paper Link - 15 Mar, 2023 - Comments: 0

A new review paper titled "Compute in-Memory with Non-Volatile Elements for Neural Networks: A Review from a Co-Design Perspective" was published by researchers at Argonne National Lab, Purdue University, and Indian Institute of Technology Madras. "With an over-arching co-design viewpoint, this review assesses the use of cross-bar based CIM for neural networks, connecting the material proper... » read more

Cooling The Data Center
By Karen Heyman - 15 Mar, 2023 - Comments: 0

Since British mathematician and entrepreneur Clive Humby coined the rallying cry, “Data is the new oil,” some 20 years ago, it has been an upbeat phrase at data science conferences. But in engineering circles, that increasingly includes a daily grind of hardware challenges, and chief among them is how to cool the places where all that data is processed and stored. An estimated 65 zettaby... » read more

Creating An Enduring National Resource
By MITRE ENGENUITY - 15 Mar, 2023 - Comments: 0

The Semiconductor Alliance. It represents our efforts to convene and collaborate with industry and university members to develop input and plans for CHIPS activity that will benefit industry and Federal Government objectives. Our first paper, American Innovation, American Growth: A Vision for the National Semiconductor Technology Center, was published November 2021 to help inform and shape gov... » read more

Blog Review: March 15
By Jesse Allen - 15 Mar, 2023 - Comments: 0

Siemens EDA's Dan Yu finds that high-quality, well-connected mass data are crucial to the success of applying machine learning to verification and recommends teams pivot to a data-centric workflow. Synopsys' Shankar Krishnamoorthy suggests that deploying AI-driven chip design and verification can free teams from iterative work, letting them focus instead on product differentiation and PPA en... » read more

Deep Learning (DL) Applications In Photomask To Wafer Semiconductor Manufacturing
By eBeam Initiative - 15 Mar, 2023 - Comments: 0

Published by the eBeam Initiative Member Companies (February 2023), this list of artificial intelligence (AI) systems used by member companies in their semiconductor manufacturing products shows progress. New examples of systems using AI include: image processing and parameter tuning in lithography tool mask metrology system B-SPline Control Point generation tool sem... » read more

AI Benchmarks Are Broken
By Jon Bunting - 14 Mar, 2023 - Comments: 0

Artificial Intelligence (AI) is shaping up to be one of the most revolutionary technologies of our time. By now you’ve probably heard that AI’s impact will transform entire industries, from healthcare to finance to entertainment, delivering us richer products, streamlined experiences, and augment human productivity, creativity, and leisure. Even non-technologists are getting a glimpse of... » read more

Research Bits: March 14
By Jesse Allen - 14 Mar, 2023 - Comments: 0

Shift register-in-memory architecture Researchers at the Singapore University of Technology and Design propose a new reconfigurable shift register-in-memory architecture for devices that can work both as a reconfigurable memory component and as a programmable shift register. The device is based on phase-change alloys, which can switch reversibly between the glassy amorphous state and the or... » read more

Chip Industry’s Technical Paper Roundup: Mar. 14
By Linda Christensen - 14 Mar, 2023 - Comments: 0

New technical papers recently added to Semiconductor Engineering’s library: [table id=86 /] If you have research papers you are trying to promote, we will review them to see if they are a good fit for our global audience. At a minimum, papers need to be well researched and documented, relevant to the semiconductor ecosystem, and free of marketing bias. There is no cost involved for us ... » read more

Integrating Siloed Data In Semiconductor Manufacturing
By Antonija Zagar - 13 Mar, 2023 - Comments: 0

In semiconductor manufacturing, huge amounts of data are generated and collected at every step in multiple production areas, with data coming from wafer fab, probe/testing, assembly, and final test. That data is usually stored separately in its respective manufacturing department, isolated from other departments. In order to analyze the production data and make better decisions, yield an... » read more

The Power Of Sensors In Transmission Systems
By Ladurner Sebastian - 13 Mar, 2023 - Comments: 0

I have always had a passion for cars. As a child, I used to spend hours playing with toy cars and imagining all sorts of incredible adventures. But as I got older, my love affair with cars only grew stronger. I became fascinated by the mechanics of these amazing machines and all the different parts that come together to make them run. And one of the parts that always intrigued me the most were ... » read more

← Older posts Newer posts →

  • Sponsors

About

Navigation

Connect With Us

Copyright ©2013-2025 SMG   |  Terms of Service  |  Privacy Policy