Metrology at Automated Test Equipment Manufacturers
By Advantest - 08 Feb, 2021 - Comments: 0

New technologies require an efficient qualification infrastructure to determine and qualify technical specifications. Metrology is the science which determines the acknowledged specification setting process based on proven international standards. This paper describes metrology and its role and benefits in automated test equipment business. By Piotr Skwierawski and Ralf Haefner. Click her... » read more

Power/Performance Bits: Feb. 8
By Jesse Allen - 08 Feb, 2021 - Comments: 0

Transparent sensor Researchers at Osaka University created a thin, flexible, transparent sensor using silver nanowire networks. High-resolution printing was used to fabricate the centimeter-scale cross-aligned silver nanowire arrays, with reproducible feature sizes from 20 to 250 micrometers. As a proof-of-concept for functionality, they used their arrays to detect electrophysiological signals... » read more

Accelerating SoC Verification Closure With Unified Verification Management Solution
By Synopsys - 08 Feb, 2021 - Comments: 0

Functional verification of system-on-chip (SoC) designs requires best-in-class tools linked together in a unified solution in order to address exponential complexity challenges. There is no one-size-fits-all method for verification. Complex designs require a combination of virtual prototyping, static checks, formal analysis, simulation, emulation and FPGA prototyping. The execution of all the t... » read more

Monitoring Critical Process Steps In 3D NAND Using Picosecond Ultrasonic Metrology With Both Thickness And Sound Velocity Capabilities
By Onto Innovation - 08 Feb, 2021 - Comments: 0

Amorphous carbon (a-C) based hard masks provide superior etch selectivity, chemical inertness, are mechanically strong, and have been used for etching deep, high aspect ratio features that conventional photoresists cannot withstand. Picosecond Ultrasonic Technology (PULSE Technology) has been widely used in thin metal film metrology because of its unique advantages, such as being a rapid, non-... » read more

Week In Review: Manufacturing, Test
By Mark LaPedus - 05 Feb, 2021 - Comments: 0

OEMs and chipmakers In recent times, automotive companies have been impacted by chip shortages, forcing vendors to temporarily shutter their plants. OEMs are experiencing manufacturing disruptions due to semiconductor shortages as some semiconductor foundries allocate production, according to IDC. "Semiconductor content growth in vehicles continues to outpace vehicle unit sales growth, with gr... » read more

Week In Review: Design, Low Power
By Jesse Allen - 05 Feb, 2021 - Comments: 0

Tools & IP Synopsys is joining Microsoft in the U.S. Department of Defense's Rapid Assured Microelectronics Prototypes (RAMP) program to support the development of IC hardware and workflow prototypes that incorporate Synopsys' assured design and manufacturing flows into Microsoft Azure. The RAMP program aims to bring commercial capabilities and speed to the development of semiconductors fo... » read more

Week In Review: Auto, Security, Pervasive Computing
By SE Staff - 05 Feb, 2021 - Comments: 0

Security Microsoft and Synopsys are working together on a secure cloud-based chip development environment for United States Department of Defense’s Rapid Assured Microelectronics Prototypes (RAMP) program. “Through this integration on the RAMP program, Synopsys' trusted design, verification and silicon IP solutions will be available in Microsoft Azure," said Mujtaba Hamid, head of Silicon ... » read more

Four Steps To Resolving Reset Domain Crossing Data-Corruption In Automotive SoCs
By Kurt Takara - 04 Feb, 2021 - Comments: 0

By Kurt Takara (Siemens EDA), Ankush Sethi (NXP), and Aniruddha Gupta (NXP) Modern automotive SoCs typically contain multiple asynchronous reset signals to ensure systematic functional recovery from unexpected situations and faults. This complex reset architecture leads to a new set of problems such as possible reset domain crossing (RDC) issues. Conventional clock domain crossing (CDC) veri... » read more

Longer Chip Lifecycles Increase Security Threat
By Ed Sperling - 04 Feb, 2021 - Comments: 0

The longer chips and electronic systems remain in use, the more they will need to be refreshed with software and firmware updates. That creates a whole new level of security risks, ranging from over-the-air intercepts to compromised supply chains. These problems have been escalating as more devices are connected to the Internet and to each other, but it's particularly worrisome when it invol... » read more

The SEMI Industry Strategy Symposium Outlook
By Paul McLellan - 04 Feb, 2021 - Comments: 0

In mid-January, SEMI organized the two-day Industry Strategy Symposium. Presentations ranged from the outlook for the overall global economy, to purifying gases and materials to parts per quadrillion, to how TSMC took the leading-edge process crown from Intel. The first day was focused on the economy and business environment, along with its impact on the semiconductor supply chain. The secon... » read more

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