category: Test, Measurement and Analytics

category: IoT, Security & Automotive

Non-Destructive Measurement of Bottom Width in Deep Trench Isolation Structures using IRCD Metrology
By Onto Innovation - 10 Sep, 2024 - Comments: 0

As scaling in semiconductor devices continues, the aspect ratios of deep trench isolation (DTI) structures have increased. DTI structures are used in power devices, power management ICs and image sensors as a method to isolate active devices by reducing crosstalk, parasitic capacitance, latch-up and allowing for an increase breakdown voltage of active devices. Measurement of these structures in... » read more

CMP Process Characterization Using White Light Interferometry
By Bruker - 10 Sep, 2024 - Comments: 0

Faster computer and electronic processors require smaller features for integrated circuits (IC), which in turn require smaller and smoother substrate surfaces. Chemical mechanical polishing (CMP) has become one of the most critical semiconductor fabrication technologies because it offers a superior means of removing unwanted topography in interlevel dielectric layers and achieving sufficient pl... » read more

Standardizing Defect Coverage In Analog/Mixed Signal Test
By Gregory Haley - 10 Sep, 2024 - Comments: 0

A newly drafted IEEE standard will bring more consistency to defect metrics in analog/mixed (AMS) designs, a long-overdue step that has become too difficult to ignore in the costly heterogeneous assemblies being deployed inside of data centers and mobile devices. Standardizing analog is no simple feat due to the legacy approach to AMS design, and this is not the first attempt at improving te... » read more

From Mobile Phones To Robotics: How The Industry Continues To Drive Innovation
By Keith Schaub - 10 Sep, 2024 - Comments: 0

I recently had the opportunity to host Pierre Cambou, Principal Analyst for Global Semiconductors at Yole Group, on the Advantest podcast. What struck me about our conversation was while we focused on what was going on in the mobile market, the entire talk was reflective of the cyclical nature of the semiconductor industry and how technology can drive intense cycles of innovation. As Pierre ... » read more

Introduction to the PXI Architecture
By NI - 10 Sep, 2024 - Comments: 0

PXI systems provide high-performance modular instruments and other I/O modules with specialized synchronization and key software features for test and measurement applications from device validation to automated production test. For a high-level understanding of PXI, see the two images in Figure 1 that compare a PXI system’s chassis, controller, and PXI(e) peripheral modules to components of ... » read more

Real-Time Safety Monitoring
By Ed Sperling - 28 Aug, 2024 - Comments: 0

Various types of semiconductor test will determine whether a chip is free of defects and meets the specification, but understanding how it's behaving in the field under real workloads and harsh ambient conditions may be very different in automotive applications, where vibration, heat, cold can disrupt the normal functioning of a chip over time and reduce its lifespan. Alex Burlak, vice presiden... » read more

Bluetooth’s New Era: The Role Of Channel Sounding And Adaptable Testing Solutions
By Jake Harnack - 07 Aug, 2024 - Comments: 0

By Jake Harnack and Alejandro Escobar Calderon Bluetooth technology has experienced a remarkable transformation since its inception, evolving from a basic tool for data transfer to a near-ubiquitous wireless technology used for audio streaming, location services, and smart-home networks. As sales of Bluetooth-enabled devices nears 5 billion units per year in 2024, the Bluetooth standard is e... » read more

AI/ML’s Role In Design And Test Expands
By Laura Peters - 06 Aug, 2024 - Comments: 1

The role of AI and ML in test keeps growing, providing significant time and money savings that often exceed initial expectations. But it doesn't work in all cases, sometimes even disrupting well-tested process flows with questionable return on investment. One of the big attractions of AI is its ability to apply analytics to large data sets that are otherwise limited by human capabilities. In... » read more

Achieving Zero Defect Manufacturing Part 2: Finding Defect Sources
By Prasad Bachiraju - 06 Aug, 2024 - Comments: 1

Semiconductor manufacturing creates a wealth of data – from materials, products, factory subsystems and equipment. But how do we best utilize that information to optimize processes and reach the goal of zero defect manufacturing? This is a topic we first explored in our previous blog, “Achieving Zero Defect Manufacturing Part 1: Detect & Classify.” In it, we examined real-time defe... » read more

Are You Ready For HBM4? A Silicon Lifecycle Management (SLM) Perspective
By Faisal Goriawalla - 06 Aug, 2024 - Comments: 0

Many factors are driving system-on-chip (SoC) developers to adopt multi-die technology, in which multiple dies are stacked in a three-dimensional (3D) configuration. Multi-die systems may make power and thermal issues more complex, and they have required major innovations in electronic design automation (EDA) implementation and test tools. These challenges are more than offset by the advantages... » read more

← Older posts Newer posts →

  • Sponsors

About

Navigation

Connect With Us

Copyright ©2013-2025 SMG   |  Terms of Service  |  Privacy Policy