category: Top Stories

category: IoT, Security & Automotive

Mask Complexity, Cost, And Change
By Gregory Haley - 22 May, 2025 - Comments: 0

Experts at the Table: As leading-edge lithography nodes push further into EUV and beyond, mask-making has become one of the most critical and costly aspects of semiconductor manufacturing. At the same time, non-EUV applications are stretching the lifetime of older tools and processes, challenging the industry to find new solutions for both ends of the spectrum. Semiconductor Engineering sat dow... » read more

Advanced Packaging Depends On Materials And Co-Design
By Katherine Derbyshire - 22 May, 2025 - Comments: 0

Multi-die assemblies offer significant opportunities to boost performance and reduce power, but these complex packages also introduce a number of new challenges, including die-to-RDL misalignment, evolving warpage profiles, and CTE mismatch. Heterogeneous integration — an umbrella term that covers many different applications and packaging requirements — holds the potential to combine com... » read more

Future-proofing AI Models
By Ann Mutschler - 21 May, 2025 - Comments: 0

Experts At The Table: Making sure AI accelerators can be updated for future requirements is becoming essential due to the rapid introduction of new models. Semiconductor Engineering sat down to discuss the challenges of future-proofing these designs with Marc Meunier, director of ecosystem development at Arm; Jason Lawley, director of product marketing for AI IP at Cadence; Paul Karazuba, vic... » read more

More Data, More Redundant Interconnects
By Ed Sperling - 19 May, 2025 - Comments: 0

The proliferation of AI dramatically increases the amount of data that needs to be processed, stored, and moved, accelerating the aging of signal paths through which that data travels and forcing chipmakers to build more redundancy into the interconnects. In the past, nearly all redundant data paths were contained within a planar chip using a relatively thick silicon substrate. But as chipma... » read more

Development Flows For Chiplets
By Brian Bailey - 15 May, 2025 - Comments: 2

Chiplets offer a huge leap in semiconductor functionality and productivity, just like soft IP did 40 years ago, but a lot has to come together before that becomes reality. It takes an ecosystem, which is currently very rudimentary. Today, many companies have hit the reticle limit and are forced to move to multi-die solutions, but that does not create a plug-and-play chiplet market. These ear... » read more

AI Accelerators Moving Out From Data Centers
By Ann Mutschler - 15 May, 2025 - Comments: 0

Experts At The Table: The explosion in AI data is driving chipmakers to look beyond a single planar SoC. Semiconductor Engineering sat down to discuss the need for more computing and the expanding role of chiplets with Marc Meunier, director of ecosystem development at Arm; Jason Lawley, director of product marketing for AI IP at Cadence; Paul Karazuba, vice president of marketing at Expedera; ... » read more

Security Risks Mount For Aerospace, Defense Applications
By Liz Allan - 12 May, 2025 - Comments: 1

Supply chain and hardware security vulnerabilities affect all industries, but they pose additional risks for the defense sector. Over-manufacturing and re-manufacturing allow chips from friendly nations to end up in the weapons of adversaries. And side-channel attacks such as power analysis or fault injection, as well as internet-based distributed denial of service (DDoS) attacks, provide a mea... » read more

Identifying Sources Of Silent Data Corruption
By Laura Peters - 08 May, 2025 - Comments: 0

Silent data errors are raising concerns in large data centers, where they can propagate through systems and wreak havoc on long-duration programs like AI training runs. SDEs, also called silent data corruption, are technically rare. But with many thousands of servers, which contain millions of processors running at high utilization rates, these damaging events become common in large fleets. ... » read more

E-Beam Inspection Proves Essential For Advanced Nodes
By Gregory Haley - 08 May, 2025 - Comments: 0

Electron-beam inspection is proving to be indispensable for finding critical defects at sub-5nm dimensions. The challenge now is how to speed up the process to make it economically palatable to fabs. E-beam inspection's notorious sensitivity-throughput tradeoff has made comprehensive defect coverage with e-beam at these advanced nodes especially problematic. For Intel’s 18A logic node (~1.... » read more

Who Is Most Likely To Link Financial And Manufacturing Data?
By Anne Meixner - 08 May, 2025 - Comments: 0

Experts at the Table: Semiconductor Engineering sat down to discuss which companies have the most to gain from linking financial data with manufacturing data analytics platforms with Dieter Rathei, CEO of DR Yield; Jon Holt, senior director of product management at PDF Solutions, Alex Burlak, vice president of advanced analytics and test at proteanTecs; and Dirk de Vries, technical program ma... » read more

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