category: Top Stories

category: IoT, Security & Automotive

Uneven Circuit Aging Becoming A Bigger Problem
By Ann Mutschler - 09 Mar, 2023 - Comments: 0

Circuit aging is emerging as a first-order design challenge as engineering teams look for new ways to improve reliability and ensure the functionality of chips throughout their expected lifetimes. The need for reliability is obvious in data centers and automobiles, where a chip failure could result in downtime or injury. It also is increasingly important in mobile and consumer electronics, w... » read more

What Makes RISC-V Verification Unique?
By Brian Bailey - 09 Mar, 2023 - Comments: 0

Semiconductor Engineering sat down to discuss the verification of RISC-V processors with Pete Hardee, group director for product management at Cadence; Mike Eftimakis, vice president for strategy and ecosystem at Codasip; Simon Davidmann, founder and CEO of Imperas Software; Sven Beyer, program manager for processor verification at Siemens EDA; Kiran Vittal, senior director of alliances partner... » read more

MIPI’s Focus Widens
By Ed Sperling - 09 Mar, 2023 - Comments: 0

Ashraf Takla, president and CEO of Mixel, sat down with Semiconductor Engineering to talk about the evolution of MIPI, from mobile displays to automotive, chiplets, and how the standard is evolving to keep up with increasing data volumes. SE: There has been a lot of activity around MIPI in automotive. What's driving that? Takla: One of the early use-cases for MIPI, after Mobile has been ... » read more

Startup Funding: February 2023
By Jesse Allen - 08 Mar, 2023 - Comments: 0

The cost of borrowing is going up, but investors continued to pour money into the chip industry in February. Collectively, 132 companies raised more than $4.5 billion last month. One of the big beneficiaries was quantum computing, with nine companies drawing a total of more than $500 million. The bulk of that went to a quantum software and services company spun out of Alphabet, but plenty wa... » read more

Metrology Strategies For 2nm Processes
By Laura Peters - 07 Mar, 2023 - Comments: 3

Metrology and wafer inspection processes are changing to keep up with evolving and new device applications. While fab floors still have plenty of OCD tools, ellipsometers, and CD-SEMs, new systems are taking on the increasingly 3D nature of structures and the new materials they incorporate. For instance, processes like hybrid bonding, 3D NAND flash devices, and nanosheet FETs are pushing the bo... » read more

Test Challenges Mount As Demands For Reliability Increase
By Anne Meixner - 07 Mar, 2023 - Comments: 0

An emphasis of improving semiconductor quality is beginning to spread well beyond just data centers and automotive applications, where ICs play a role in mission- and safety-critical applications. But this focus on improved reliability is ratcheting up pressure throughout the test community, from lab to fab and into the field, in products where transistor density continues to grow — and wh... » read more

Standards: The Next Step For Silicon Photonics
By Karen Heyman - 07 Mar, 2023 - Comments: 0

Testing silicon photonics is becoming more critical and more complicated as the technology is used in new applications ranging from medicine to cryptography, lidar, and quantum computing, but how to do that in a way that is both consistent and predictable is still unresolved. For the past three decades, photonics largely has been an enabler for high-speed communications, a lucrative market t... » read more

Auto Cyberattacks Becoming More Widespread
By John Koon - 02 Mar, 2023 - Comments: 0

As vehicles become smarter, more complex, and increasingly connected, they also become more prone to cyberattacks. The challenge now is to keep pace with hackers, who are continually devising new and innovative ways to attack both software and hardware in vehicles. Recent statistics bear this out. In 2022, there was a big spike in deep/dark web activity and incidents related to application p... » read more

AI: Engineering Tool Or Threat To Jobs?
By Ed Sperling - 02 Mar, 2023 - Comments: 0

Semiconductor Engineering sat down to talk about using AI for designing and testing complex chips with Michael Jackson, corporate vice president for R&D at Cadence; Joel Sumner, vice president of semiconductor and electronics engineering at National Instruments; Grace Yu, product and engineering manager at Meta; David Pan, professor in the Department of Electrical and Computer Engineering a... » read more

Designing for Data Flow
By Marie C. Baca - 02 Mar, 2023 - Comments: 0

Movement and management of data inside and outside of chips is becoming a central theme for a growing number of electronic systems, and a huge challenge for all of them. Entirely new architectures and techniques are being developed to reduce the movement of data and to accomplish more per compute cycle, and to speed the transfer of data between various components on a chip and between chips ... » read more

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