Reliability Concerns Shift Left Into Chip Design


Demand for lower defect rates and higher yields is increasing, in part because chips are now being used for safety- and mission-critical applications, and in part because it's a way of offsetting rising design and manufacturing costs. What's changed is the new emphasis on solving these problems in the initial design. In the past, defectivity and yield were considered problems for the fab. Re... » read more

The High But Often Unnecessary Cost Of Coherence


Cache coherency, a common technique for improving performance in chips, is becoming less useful as general-purpose processors are supplemented with, and sometimes supplanted by, highly specialized accelerators and other processing elements. While cache coherency won't disappear anytime soon, it is increasingly being viewed as a luxury necessary to preserve a long-standing programming paradig... » read more

Challenges With Stacking Memory On Logic


Experts at the Table: Semiconductor Engineering sat down to discuss the changes in design tools and methodologies needed for 3D-ICs, with Sooyong Kim, director and product specialist for 3D-IC at Ansys; Kenneth Larsen, product marketing director at Synopsys; Tony Mastroianni, advanced packaging solutions director at Siemens EDA; and Vinay Patwardhan, product management group director at Cadence... » read more

Next Steps For Panel-Level Packaging


Tanja Braun, group manager at Fraunhofer Institute for Reliability and Microintegration (IZM), sat down with Semiconductor Engineering to talk about III-V device packaging, chiplets, fan-out and panel-level processing. Fraunhofer IZM recently announced a new phase of its panel-level packaging consortium. What follows are excerpts of that discussion. SE: IC packaging isn’t new, but years a... » read more

GaN Application Base Widens, Adoption Grows


Gallium nitride (GaN) is beginning to show up across a broad range of power semiconductor applications due to its wide bandgap, enabling fast-charging, very high speeds, and much smaller form factors than silicon-based chips. Unlike silicon carbide (SiC), another wide-bandgap technology, GaN is a lateral rather than a vertical device. GaN tops out at about 900 volts, which limits its use in ... » read more

Batteries Have Moving Parts


The race is on to make lithium-ion batteries safer, to increase the amount of energy that can be drawn out of these devices, and to reduce the time it takes to charge them up again. Transistors and other electronic components depend on the movement of electrons, which are effectively massless and dimensionless relative to the semiconductor, metal, and dopant atoms that surround them. A batte... » read more

Business, Technology Challenges Increase For Photomasks


Experts at the Table: Semiconductor Engineering sat down to discuss optical and EUV photomasks issues, as well as the challenges facing the mask business, with Naoya Hayashi, research fellow at DNP; Peter Buck, director of MPC & mask defect management at Siemens Digital Industries Software; Bryan Kasprowicz, senior director of technical strategy at Hoya; and Aki Fujimura, CEO of D2S. What f... » read more

Securing Short-Range Communications


Short-range wireless communication technology is in widespread use and growing rapidly, adding conveniences for consumers while also opening the door to a whole range of cyberattacks. This technology is common across a variety of applications, from wireless key fobs to unlock a car and start the ignition, to tags used to help drivers find misplaced items such as car keys. RFID also is starti... » read more

Revving Up SiC And GaN


Silicon carbide (SiC) and gallium nitride (GaN) are becoming more popular for power electronics, particularly in automotive applications, driving down costs as volumes scale up and increasing the demand for better tools to design, verify, and test these wide-bandgap devices. Both SiC and GaN are proving essential in areas such as battery management in electric vehicles. They can handle much ... » read more

Amdahl Limits On AI


Software and hardware both place limits on how fast an application can run, but finding and eliminating the limitations is becoming more important in this age of multicore heterogeneous processing. The problem is certainly not new. Gene Amdahl (1922-2015) recognized the issue and published a paper about it in 1967. It provided the theoretical speedup for a defined task that could be expected... » read more

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