category: Top Stories

category: IoT, Security & Automotive

Geo-Spatial Outlier Detection
By Anne Meixner - 19 Jul, 2021 - Comments: 0

Comparing die test results with other die on a wafer helps identify outliers, but combining that data with the exact location of an outlier offers a much deeper understanding of what can go wrong and why. The main idea in outlier detection is to find something in or on a die that is different from all the other dies on a wafer. Doing this in the context of a die’s neighbor has become easie... » read more

Massive IoT Interop Fuels Protocol Battle
By Bryon Moyer - 15 Jul, 2021 - Comments: 0

Wireless standards are plentiful, but most are not capable of being scaled to the level of a smart city. As a result, such networks have been built application-by-application using proprietary stacks, often with non-interoperable network layers. That, in turn, has slowed the proliferation of dense wireless connectivity at scale. “In a hyper-connected world, connectivity choices are driv... » read more

CEO Outlook: Chiplets, Longer IC Lifetimes, More End Markets
By Ed Sperling - 14 Jul, 2021 - Comments: 1

Experts at the Table: Semiconductor Engineering sat down to discuss chiplets, longer IC lifetimes, and a spike in the number of end applications with Lip-Bu Tan, CEO of Cadence; Simon Segars, CEO of Arm; Joseph Sawicki, executive vice president of Siemens IC EDA; John Kibarian, CEO of PDF Solutions; Prakash Narain, president and CEO of Real Intent; Dean Drako, president and CEO of IC Manage; an... » read more

Chipmakers Getting Serious About Integrated Photonics
By Brian Bailey - 12 Jul, 2021 - Comments: 3

Integrating photonics into semiconductors is gaining traction, particularly in heterogeneous multi-die packages, as chipmakers search for new ways to overcome power limitations and deal with increasing volumes of data. Power has been a growing concern since the end of Dennard scaling, which happened somewhere around the 90nm node. There are more transistors per mm², and the wires are thinne... » read more

Reducing Power Delivery Overhead
By Brian Bailey - 08 Jul, 2021 - Comments: 0

The power delivery network (PDN) is a necessary overhead that typically remains in the background — until it fails. For chip design teams, the big question is how close to the edge are they willing to push it? Or put differently, is the gain worth the pain? This question is being scrutinized in very small geometry designs, where margins can make a significant difference in device performan... » read more

Lower Power Chips: What To Watch Out For
By Ann Mutschler - 08 Jul, 2021 - Comments: 0

Low-power design in advanced nodes and advanced packaging is becoming a multi-faceted, multi-disciplinary challenge, where a long list of issues need to be solved both individually and in the context of other issues. With each new leading-edge process node, and with increasingly dense packaging, the potential for problematic interactions is growing. That, in turn, can lead to poor yield, cos... » read more

Retimers Replacing Redrivers As Signal Speeds Increase
By Bryon Moyer - 08 Jul, 2021 - Comments: 1

Retimers are undergoing a renaissance as new PHY protocols prove too demanding for redrivers. Redrivers and retimers both have been used to extend wired signal reach over the years. But redrivers have dominated this space due to their relative simplicity and lower cost. That balance is beginning to change. “A retimer represents three things no one wants in their system — area, cost, a... » read more

Startup Funding: June 2021
By Jesse Allen - 07 Jul, 2021 - Comments: 0

June was the month of mega-rounds for autonomous driving companies, with three pulling in well over $100M. All three are based in China, but their products range from chips to full robotaxi services. Also in the automotive space, an EV battery manufacturer raised over $2B, a solid-state lidar developer drew $300M — and those are just the largest rounds. Plus, new HPC architectures, GAA metrol... » read more

5G Chips Add Test Challenges
By Bryon Moyer - 06 Jul, 2021 - Comments: 1

The advent of chips supporting millimeter-wave (mmWave) 5G signals is creating a new set of design and testing challenges. Effects that could be ignored at lower frequencies are now important. Performing high-volume test of RF chips will require much more from automated test equipment (ATE) than is required for chips operating below 6 GHz. “MmWave design is a pretty old thing,” said Y... » read more

Cleaning Up During IC Test
By Anne Meixner - 06 Jul, 2021 - Comments: 2

Test is a dirty business. It can contaminate a unit or wafer, or the test hardware, which in turn can cause problems in the field. While this has not gone unnoticed, particularly as costs rise due to increasing pin and ball density, and as more chips are bundled together in a package, the cost of dirt continues to be a focus. Cleaning recipes for test interface boards are changing, and analy... » read more

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