category: Videos

category: IoT, Security & Automotive

Using Deep Data For Improved Reliability Testing
By Ed Sperling - 08 Jan, 2024 - Comments: 0

Reliability testing always has been a challenge for semiconductor companies, but it’s becoming much more difficult as devices continue to shrink, as they’re integrated together in advanced packages, and as they’re utilized under different conditions with life expectancy that varies by application and use case. Nir Sever, senior director of business development at proteanTecs, and Luca Mor... » read more

Densification Of RF Designs
By Ann Mutschler - 20 Dec, 2023 - Comments: 0

It’s challenging enough to deal with wireless signals at the 5G and 6G frequencies. But with increased density in chips crammed into smaller packages, higher power, beam forming, and MIMO, design requirements are very different than in the past. Simple parasitic extraction no longer is sufficient. Daren McClearnon, product manager for RF and microwave simulation at Keysight, talks about the n... » read more

Very Short Reach SerDes In Data Centers
By Ed Sperling - 13 Dec, 2023 - Comments: 0

Speed is critical inside of data centers, and the distance that signals have to travel can have a big impact on time to results. But there are a number of variables that need to be considered, including what is an acceptable loss, how much power can be dissipated in a server rack, and what are the various connection options being used. Keivan Javadi Khasraghi, staff technical product manager at... » read more

Improving AI Productivity With AI
By Ed Sperling - 28 Nov, 2023 - Comments: 0

AI is showing up or proposed for nearly all aspects of chip design, but it also can be used to improve the performance of AI chips and to make engineers more productive earlier in the design process. Matt Graham, product management group director at Cadence, talks with Semiconductor Engineering about the role of AI in identifying patterns that are too complex for the human brain to grasp, how t... » read more

What To Do About Electrostatic Discharge
By Ed Sperling - 20 Nov, 2023 - Comments: 0

Electrostatic discharge is a well-understood phenomenon, but it’s becoming more difficult to plan for as single chips are replaced by multiple chips or chiplets in a package, and as the density of components continues to increase with each new node. In both cases, the probability for failure increases unless these sudden shocks are addressed in the design. Dermott Lynch, director of product m... » read more

Total Overlay With Multiple RDLs
By Ed Sperling - 13 Nov, 2023 - Comments: 0

As Advanced IC Substrates (AICS) add more RDL layers, requiring additional via connections between the RDL layers, the potential for cumulative overlay shift increases. This overlay shift can lead to longer RDL traces, which increases interconnect resistance, resulting in lower yield. Keith Best, director of product marketing, for lithography at Onto Innovation, talks about total overlay — th... » read more

Designing Chips For Outer Space
By Ed Sperling - 08 Nov, 2023 - Comments: 0

If designing chips in cars sounds difficult, try designing them for space. There are huge temperature swings, and more radioactive particles than on Earth, which can cause single-event upsets, transients, functional interrupts, and latch-ups. A destructive latch-up can ruin a device, and in space that could transform an expensive piece of hardware into space junk. Ian Land, senior director for ... » read more

Coding And Debugging RISC-V
By Ann Mutschler - 06 Nov, 2023 - Comments: 0

As monolithic device scaling continues to wind down and evolve toward increasingly heterogeneous designs, it has created an inflection point for chip architects to create customized cores that are much more energy efficient and faster than off-the-shelf processors. Zdeněk Přikryl, CTO of Codasip, talks about where RISC-V fits into this picture, using a modular ISA and custom instruction layer... » read more

DSP Techniques For High-Speed SerDes
By Ed Sperling - 23 Oct, 2023 - Comments: 0

Sensors everywhere, more connected devices, and the rollout of smart everything has created a flood of data. The question now is how to best handle all of that data, where to process it, and how to move it locally and to the outside network. Madhumita Sanyal, technical product manager at Synopsys, talks about the need for continuous performance improvements in SerDes, PCIe, NRZ, and PAM4, and w... » read more

Memory And High-Speed Digital Design
By Ann Mutschler - 18 Oct, 2023 - Comments: 0

As DRAM gets faster, timing constraints, jitter, and signal integrity become harder to control. The real challenge is to understand what can go wrong early in the design process, and that becomes more complex with each new version of memory and higher signal speeds. Stephen Slater, product manager for EDA products at Keysight, talks about how simulation can be applied to these issues, what to t... » read more

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