Advanced Part Average Testing For Chips


Part average testing, one of the mainstays of semiconductor test, is becoming much more challenging at advanced nodes and in multi-die assemblies. In the past, PAT produced a Gaussian distribution that made it relatively simple to find outliers. That's no longer the case. Advanced packaging and leading-edge designs have unique attributes that determine which rules apply, such as the thickness o... » read more

Machine Learning In Semiconductor Manufacturing


Second in a seven-part series: Machine learning is a mathematical construct that is the foundation for nearly all the advancements in AI. ML came first, but it remains relevant even today. It can be applied to semiconductor fab for such things as predictive maintenance of manufacturing equipment, rather than just maintenance on a schedule, which decreases downtime. But getting this right is har... » read more

AI, From A To Z


First in a seven-part series: What's the difference between AI, ML, DL, LLMs, and agentic AI? Is it truly revolutionary, or is it an evolutionary series of steps that have enabled machines to do much more than in the past? Jon Herlocker, vice president and general manager of software analytics at Cohu, talks about the evolution of AI over nearly 70 years, the chain of innovation that has enable... » read more

Workload-Specific Hardware Accelerators


Workload-specific hardware accelerators are becoming essential in large data centers for two reasons. One is that general-purpose processing elements cannot keep up with the workload demands or latency requirements. The second is that they need to be extremely efficient due to limited electricity from the grid and the high cost of cooling these devices. Sharad Chole, chief scientist and co-foun... » read more

What’s Different About HBM4


Memory bandwidth is limiting the flow of huge datasets that are needed to train AI models. There is much more data to process, store, and retrieve, but the speed at which that data moves through high-bandwidth memory (HBM) stacks is significantly lower than the speed at which data can be processed. Frank Ferro, group director for product management at Cadence, talks about the new HBM4 standard,... » read more

Issues In Ramping Advanced Packaging


Multi-die assemblies require significantly more test data than a monolithic chip. Thermal mismatch between different layers can cause warping, which puts stress on the bonds that connect those layers, resulting in failures during testing. The big problem is that traditional daisy-chained test approaches cannot pinpoint where problems are occurring. Instead, they provide a go/no-go for the entir... » read more

Changes In Scan Test Data


Bigger designs with hundred of cores are creating an explosion in the volume of scan test data, significantly bumping up the amount of time spent on test. That raises the cost of test, forcing chipmakers to trade off higher costs with reliability. The solution is to raise the level of abstraction for scan tests, using a bus and packetized data that can run at much higher frequencies than is pos... » read more

Accelerating IP Reuse


Semiconductors are no longer monolithic designs developed by a single company. There is more third-party IP from different sources — as many as 1,000 different IPs in a complex SoC — and all of that needs to be integrated and work as one system, something that can require a lot of effort and time. Insaf Meliane, product management and marketing director at Arteris, talks about how the new v... » read more

AI In The IC Equipment Ecosystem


AI is playing an increasingly critical role in improving semiconductor equipment and processes, which are necessary as the industry moves to advanced manufacturing processes. This requires more steps, tighter integration and analysis of those various steps, and better optimization of tools. David Fried, corporate vice president at Lam Research, talks about how to accelerate the development of A... » read more

Silent Data Corruption


Everyone expects their compute systems to generate the correct answer. When they don't, it's cause for alarm, because it's not always clear how long the problem has persisted. Even worse, chips and systems are now so complex that it may require a unique sequence of operations to trigger a silent data error, and they may show up only occasionally, and maybe only after months or years of use in t... » read more

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