Secure Movement Of Data In Test

Why heterogeneous integration changes how data is used in manufacturing.


Historically, test data flowed out of the tester and was loaded into a file. But with heterogeneous integration, including chiplets and IP from multiple vendors, test data is now being streamed across the manufacturing floor where it can be used to make real-time decisions. Eli Roth, product manager for smart manufacturing at Teradyne, talks with Semiconductor Engineering about challenges in data integration and sharing, including concerns about how to secure data, how to allow different people to access relevant data as needed throughout the manufacturing cycle, and how to ensure that none of this slows down the time it takes to get a chip out the door.

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