Chip Industry Technical Paper Roundup: Oct. 1

KAN for lightweight edge inference; bendable non-silicon RISC-V microprocessor; low-latency, energy-efficiency LLM inference; using both faces of polar semiconductor wafers; low-level SRAM cache 3DIC; formal verification; volatile memristors; 3D multilayer glass structure.

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New technical papers recently added to Semiconductor Engineering’s library:

Technical Paper Research Organizations
Hardware Acceleration of Kolmogorov-Arnold Network (KAN) for Lightweight Edge Inference Georgia Tech, TSMC and National Tsing Hua University.
Bendable non-silicon RISC-V microprocessor Pragmatic Semiconductor, Qamcom, and Harvard University
Breakthrough low-latency, high-energy-efficiency LLM inference performance using NorthPole IBM Research
Using both faces of polar semiconductor wafers for functional devices Cornell University and Polish Academy of Sciences
Towards Fine-grained Partitioning of Low-level SRAM Caches for Emerging 3D-IC Designs imec
Analogous Alignments: Digital “Formally” meets Analog Infineon Technologies
VVTEAM: A Compact Behavioral Model for Volatile Memristors Technion – Israel Institute of Technology
Characterizing the Broadband RF Permittivity of 3D-Integrated Layers in a
Glass Wafer Stack from 100 MHz to 30 GHz
NIST

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