Critical Area-Based Test Pattern Optimization For High-Quality Test

How to set a target metric and choose the best test patterns.


Among the challenges for DFT engineers is how to set a target metric for ATPG and how to choose the best set of patterns. Traditional coverage targets based on the number of faults detected doesn’t consider the likelihood of one fault occurring compared to another. Tessent developed total critical area ATPG technology that enables the sorting and ordering of patterns based on their likelihood to detect defects. Users can create a pattern set for multiple fault models in one run, reducing the overall pattern size significantly.

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