Design And Measurement Requirements For Short Flow Test Arrays To Characterize Emerging Memories

How a short-flow based characterization of memory arrays using a cross point array approach reduces costs.


Emerging non-volatile memories are becoming increasingly attractive for embedded and storage-class applications. Among the development challenges of Back-End integrated memory cells are long learning cycle and high wafer cost. We propose a short-flow based characterization of Memory Arrays using a Cross Point Array approach. A detail analysis of design requirements and testability confirms feasibility of the short-flow based solution to reduce Turn-Around Time and development costs.

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