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Design And Measurement Requirements For Short Flow Test Arrays To Characterize Emerging Memories


Emerging non-volatile memories are becoming increasingly attractive for embedded and storage-class applications. Among the development challenges of Back-End integrated memory cells are long learning cycle and high wafer cost. We propose a short-flow based characterization of Memory Arrays using a Cross Point Array approach. A detail analysis of design requirements and testability confirms feas... » read more

In-Memory Computing Challenges Come Into Focus


For the last several decades, gains in computing performance have come by processing larger volumes of data more quickly and with superior precision. Memory and storage space are measured in gigabytes and terabytes now, not kilobytes and megabytes. Processors operate on 64-bit rather than 8-bit chunks of data. And yet the semiconductor industry’s ability to create and collect high quality ... » read more