Techniques to reduce the requirements for test points without sacrificing coverage.
Design for manufacturing (DFM) has become a proactive part of the design process, but the same cannot be said for DFT. Whereas “left-shifting” DFM has reduced manufacturing problems, increased yield, reduced scrap levels, and simplified engineering rework, testability-related improvements have stayed flat during that same time. Unfortunately, as assembly costs have come down, and test-related costs have remained flat, in percentage terms, test is now a significant portion of modern electronics assembly costs.
This paper describes the many techniques that can be used to reduce the requirements for test points across a design without compromising coverage. To read more, click here.
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