tag: analog

Sampling Quality – General Analog Concepts
By NI - 06 Mar, 2017 - Comments: 0

This tutorial is part of the NI Analog Resource Center. Each tutorial will teach you a specific topic by explaining the theory and giving practical examples. This tutorial covers the basics of analog sampling quality. Topics discussed in this white paper: Resolution Measurement Sensitivity Accuracy and Example Accuracy Calculations Difference between Precision and Accuracy Noise ... » read more

Devices Threatened By Analog Content?
By Brian Bailey - 09 Feb, 2017 - Comments: 0

As the amount of analog content in connected devices explodes, ensuring that the analog portion works properly has taken on a new level of urgency. Analog circuitry is required for interpreting the physical world and for moving data to other parts of the system, while digital circuitry is the fastest way to process it. So a sensor that gives a faulty reading in a car moving at high speed or ... » read more

Tech Talk: Timing Closure
By Ed Sperling - 29 Dec, 2016 - Comments: 0

Arteris' George Janac talks about timing closure issues in advanced chips and why this has reared its head again for the first time in a decade.   Related Stories Timing Closure Issues Resurface Adding more features and more power states is making it harder to design chips at 10nm and 7nm. » read more

Analog’s Rising Status
By Ann Mutschler - 08 Dec, 2016 - Comments: 1

As more sensors and actuators are added into electronic devices, pressure is growing to more seamlessly move data seamlessly back and forth between analog and digital circuitry. [getkc id="37" kc_name="Analog"] and digital always have fit rather uncomfortably together, and that discomfort has grown as [getkc id="81" kc_name="SoCs"] are built using smaller feature sizes. While digital transis... » read more

Optimizing Multiple IoT Layers
By Ann Mutschler - 01 Dec, 2016 - Comments: 0

As the number of connected devices rises, so do questions about how to optimize them for target markets, how to ensure they play nicely together, and how to bring them to market quickly and inexpensively. [getkc id="76" kc_name="IoT"] is broad term that encompasses a lot of disparate pieces for devices, systems, and connected systems. At the highest levels are hardware and software, but with... » read more

Oscilloscopes: The EE’s Stethoscope
By Gale Morrison - 17 Nov, 2016 - Comments: 0

Oscilloscopes are like the electricity to your house. You don't give it much thought until a storm knocks it out. The entire electronics industry can't function without oscilloscopes. But this equipment is such a constant and so consistent, we sometimes forget it's there. Semiconductor Engineering spent time with three Test & Measurement (T&M) industry stalwarts to talk about Oscillo... » read more

What’s Next For IoT Security?
By Ed Sperling - 07 Nov, 2016 - Comments: 0

By Ed Sperling & Jeff Dorsch With security, the little things can cause as much of a problem as the big things. As shown in the recent distributed denial of service attack (DDoS) on Dyn, which created waves of attacks using Mirai malware, connected devices of all sizes can be amassed into an army of bots that can bring even giants like Amazon and Netflix to a dead stop. This attack was ... » read more

Moving Automotive Test Into The Analog Domain
By Steve Pateras - 29 Sep, 2016 - Comments: 0

The amount of electronic content in passenger cars continues to grow rapidly, driven mainly by the integration of various advanced safety features. The industry’s move towards fully autonomous vehicles promises to even further increase the number of these safety features and consequentially, the electronic content required in each vehicle. Recent reports indicate that hundreds of semicondu... » read more

Analog Fault Simulation Challenges And Solutions
By Mentor, a Siemens Business - 28 Sep, 2016 - Comments: 0

The test time for digital circuit blocks in ICs has greatly decreased in the last 20 years, thanks to scan-based design-for-test (DFT), automatic test pattern generation (ATPG) tools, and scan compression. These technologies have greatly reduced the number of test vectors applied by automatic test equipment (ATE) while maximizing the coverage of a wide range of defect types. But for analog c... » read more

Noise Killed My Chip
By Brian Bailey - 08 Sep, 2016 - Comments: 0

In the past, noise was considered an annoyance, especially for analog circuitry. But today chips are actually failing because insufficient analysis was performed. Noise types that used to be second-order effects are becoming primary factors that have to be considered. This is happening at the same time that noise margins are getting smaller, both in the amplitude and temporal dimensions. It ... » read more

← Older posts Newer posts →

  • Sponsors

About

Navigation

Connect With Us

Copyright ©2013-2024 SMG   |  Terms of Service  |  Privacy Policy