Week In Review: Design, Low Power

By Jesse Allen - 22 Mar, 2019 - Comments: 0

Synopsys announced several new products: a new test family, a physical verification solution, and a software library for neural net SoCs. TestMAX, the new family of test products, includes soft error analysis and X-tolerant logic BIST for automotive test and functional safety requirements. TestMAX enables test through functional high-speed interfaces and supports early validation of DFT logi... » read more

Gaps In 5G Test

By Kevin Fogarty - 20 Mar, 2019 - Comments: 0

Add one more industry to the long list that analysts expect 5G technology to disrupt—test. While the initial versions of this wireless technology will be little more than a faster version of 4G, concern is growing about exactly how to test the second phase of this technology, which will be based upon millimeter wave. A number of fundamental problems need to be addressed. Among them: T... » read more

IC Test: Doing It At The Right Place At The Right Time

By Rohit Kapur - 14 Mar, 2019 - Comments: 1

In the real world, we are slaves to our environment. The decisions we make are dependent on the resources available at any given time. In school, I remember coming up with a binary decision diagram (BDD) variable-ordering algorithm that relied on partial BDDs. Was that the best algorithm to determine the variable ordering of a BDD for a design? Probably not. However, it was easy to do as a coll... » read more

The 3 Main Obstacles To Zero DPPM And How To Overcome Them

By Randy Hierbaum - 12 Mar, 2019 - Comments: 0

As we all well know, there are multiple mission critical applications in today’s “Age of Smart” that are calling for zero DPPM (defective parts per million) in semiconductors and electronic systems. In industries such as automotive, medical, aerospace, and more, where lives are at stake, defective parts are not an option. The quality imperative However, with the ever-growing complexi... » read more

Home Automation IoT Company Cuts ASIC Testing Costs

By DELTA, a part of FORCE Technology - 12 Mar, 2019 - Comments: 0

digitalSTROM develops smart home automation solutions providing users with superior comfort and a whole new style of living. Based on proprietary ASIC and software, digitalSTROM’s solutions connect electrical household appliances through existing power lines and enable an intelligent home via light switches, free speaking using Amazon Echo, and other apps. Challenges At the heart of digit... » read more

Using Sensor Data To Improve Yield And Uptime

By Ed Sperling - 21 Feb, 2019 - Comments: 2

Semiconductor equipment vendors are starting to add more sensors into their tools in an effort to improve fab uptime and wafer yield, and to reduce cost of ownership and chip failures. Massive amounts of data gleaned from those tools is expected to provide far more detail than in the past about multiple types and sources of variation, including when and where that variation occurred and how,... » read more

Why Analog Designs Fail

By Brian Bailey - 14 Feb, 2019 - Comments: 2

The gap between analog and digital reliability is growing, and digital designs appear to be winning. Reports show that analog content causes the most test failures and contributes significantly more than digital to field returns. The causes aren't always obvious, though. Some of it is due to the maturity of analog design and verification. While great strides have been made in digital circuit... » read more

Anticipating And Addressing 5G Testing Challenges

By Judy Davies - 13 Feb, 2019 - Comments: 0

It’s no surprise that each new generation of ICs raises new sets of challenges in device testing. Changes in pin counts, data-transfer rates and interface protocols present different requirements. With the coming fifth generation (5G) of semiconductor technology, producers of automatic test equipment (ATE) must develop new test solutions with advanced capabilities on several fronts. Perhap... » read more

Mapping The Impact Of Heat On Photonics

By Ed Sperling - 12 Feb, 2019 - Comments: 0

Heat and various types of noise can disrupt optical signals in silicon photonics applications, pushing light into frequencies that generally are filtered out. Unless those filters are adjusted, data may be lost or incomplete, and in the case of streaming data it may be impossible to reconstruct. But predicting when and how physical effects will affect light isn't always obvious, which makes ... » read more

Reliability Becomes The Top Concern In Automotive

By Ed Sperling And Susan Rambo - 12 Feb, 2019 - Comments: 4

Reliability is emerging as the top priority across the hottest growth markets for semiconductors, including automotive, industrial and cloud-based computing. But instead of replacing chips every two to four years, some of those devices are expected to survive for up to 20 years, even with higher usage in sometimes extreme environmental conditions. This shift in priorities has broad ramificat... » read more

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Knowledge Centers
Entities, people and technologies explored

Shift Left Is The Tip Of The Iceberg

A transformative change is underway for semiconductor design and EDA. New languages, models, and abstractions will need to be created.

by Brian Bailey

Partitioning In The Chiplet Era

Understanding how chiplets interact under different workloads is critical to ensuring signal integrity and optimal performance in heterogeneous designs.

by Ann Mutschler

3.5D: The Great Compromise

Pros and cons of a middle-ground chiplet assembly that combines 2.5D and 3D-IC.

by Ed Sperling

Legacy Process Nodes Going Strong

The critical, and growing, significance of mature node chips and processes.

by Bryon Moyer

AI’s Role In Chip Design Widens, Drawing In New Startups

Focus is on letting engineers do much more with the same or fewer resources — and less drudgery.

by Karen Heyman

Key Technologies To Extend EUV To 14 Angstroms

Alongside high-NA EUV will be better-performing photoresists, reduced roughness using passivation and etch, and lateral etching to reduce tip-to-tip dimensions.

by Laura Peters

Memory Fundamentals For Engineers

eBook: Nearly everything you need to know about memory, including detailed explanations of the different types of memory; how and where these are used today; what's changing, which memories are successful and which ones might be in the future; and the limitations of each memory type.

by The SE Staff

What Comes After HBM For Chiplets

The standard for high-bandwidth memory limits design freedom at many levels, but that is required for interoperability. What freedoms can be taken from other functions to make chiplets possible?