Improving Circuit Reliability


Carey Robertson, product marketing director at Mentor, a Siemens Business, examines reliability at advanced and mainstream nodes, particularly in automotive and industrial applications, what’s driving growing concern about the reliability and fidelity of analog circuits, and the impact of running circuits for longer periods of time under different voltage and environmental conditions. » read more

Parasitic Extraction of MIM/MOM Capacitors In Analog/RF Designs


The extensive use of MIM/MOM capacitors in analog/RF designs presents designers with extraction challenges that typically require multiple extraction techniques. The Calibre xACT platform offers analog/RF designers the fast performance of a rule-based extraction engine, and the capacity and performance of a field solver, to efficiently extract all parasitic components in a timely manner, with t... » read more

Week In Review: Design, Low Power


Processors Arm rolled out a micro neural processing unit that, when combined with its newest microcontroller, can increase machine learning performance by up to 480 times. The company is aiming the MCU and co-processor across a wide swath of applications. Worth noting is that Arm calls its Cortex-M55 an AI-capable processor, rather than a microcontroller, as the lines between the various proce... » read more

Failure Analysis Becoming Critical To Reliability


Failure analysis is rapidly becoming a complex, costly and increasingly time-consuming must-do task as demand rises for reliability across a growing range of devices used in markets ranging from automotive to 5G. From the beginning, failure analysis has been about finding out what went wrong in semiconductor design and manufacturing. Different approaches, tools and equipment have improved ov... » read more

Analog Simulation At 7/5/3nm


Hany Elhak, group director of product management at Cadence, talks with Semiconductor Engineering about analog circuit simulation at advanced nodes, why process variation is an increasing problem, the impact of parasitics and finFET stacking, and what happens when gate-all-around FETs are added into the chip. » read more

How Chips Age


Andre Lange, group manager for quality and reliability at Fraunhofer IIS’ Engineering of Adaptive Systems Division, talks about circuit aging, whether current methods of predicting reliability are accurate for chips developed at advanced process nodes, and where additional research is needed. » read more

Analog: Avoid Or Embrace?


We live in an analog world, but digital processing has proven quicker, cheaper and easier. Moving digital data around is only possible while the physics of wires can be safely abstracted away enough to provide reliable communications. As soon as a signal passes off-chip, the analog domain reasserts control for modern systems. Each of those transitions requires a data converter. The usage ... » read more

What Engineers Are Reading And Watching


By Brian Bailey And Ed Sperling An important indicator of where the chip industry is heading is what engineers are reading and what videos they are watching. While some subjects remain on top, such as the level of interest in the latest manufacturing technologies, other areas come and go. The stories with the biggest traffic numbers are almost identical to last year. Readers want to know wh... » read more

Addressing Pain Points In Chip Design


Semiconductor Engineering sat down to discuss the impact of multi-physics and new market applications on chip design with John Lee, general manager and vice president of ANSYS' Semiconductor Business Unit; Simon Burke, distinguished engineer at Xilinx, Duane Boning, professor of electrical engineering and computer science at MIT; and Thomas Harms, director EDA/IP Alliance at Infineon. What foll... » read more

How 5G Affects Test


David Hall, head of semiconductor marketing at National Instruments, talks with Semiconductor Engineering about architectural changes to infrastructure due to the rollout of 5G and how the move from macrocells to small cells is changing test requirements.         Subscribe to Semiconductor Engineering's YouTube Channel here » read more

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