Speeding Up The R&D Metrology Process

By Mark LaPedus - 16 Jul, 2020 - Comments: 0

Several chipmakers are making some major changes in the characterization/metrology lab, adding more fab-like processes in this group to help speed up chip development times. The characterization/metrology lab, which is generally under the radar, is a group that works with the R&D organization and the fab. The characterization lab is involved in the early analytical work for next-generati... » read more

What’s In Your IP?

By Ed Sperling - 21 Feb, 2020 - Comments: 0

Jeff Markham, software architect at ClioSoft, talks with Semiconductor Engineering about IP traceability in markets such as automotive and aerospace, what’s actually in IP, what should not be in that IP from a security standpoint, and how all of this data can used to avert system reliability issues in the future. » read more

Cloud Characterization

By WeiLii Tan - 19 Dec, 2019 - Comments: 0

Library characterization is a compute-intensive task that takes days to weeks to complete. Runtimes for library characterization are increasing due to larger library sizes, higher number of operating conditions to characterize, as well as the need for statistical variation modeling in libraries at 22/20nm and smaller process nodes. Cloud platforms offer a way to accelerate library characterizat... » read more

Challenges In IP Reuse

By Ed Sperling - 09 Dec, 2019 - Comments: 0

Jeff Markham, software architect at ClioSoft, explains why IP reuse is so important in advanced process node SoC chip designs, what companies need to keep track of when working with third-party IP, and how it needs to be characterized. » read more

Next-Generation Liberty Verification And Debugging

By WeiLii Tan - 27 Sep, 2018 - Comments: 1

Accurate library characterization is a crucial step for modern chip design and verification. For full-chip designs with billions of transistors, timing sign-off through simulation is unfeasible due to run-time and memory constraints. Instead, a scalable methodology using static timing analysis (STA) is required. This methodology uses the Liberty file to encapsulate library characteristics such ... » read more

NIWeek Test Talk

By Jeff Dorsch - 12 Jul, 2018 - Comments: 0

Semiconductor Engineering sat down with David Hall, Chief Marketer, Semiconductor, of National Instruments, and Mike Watts, NI’s Senior Solutions Marketer, Semiconductor Test, during NIWeek 2018 in Austin, Texas. “One of the opportunities for National Instruments is that over the last 10 years, we’ve seen larger semiconductor organizations change the way they do testing both for R&... » read more

Addressing Memory Characterization Capacity And Throughput Requirements With Dynamic Partitioning

By Cadence - 12 Oct, 2016 - Comments: 0

Typical memory characterization techniques using memory compilers and instance-specific memories have a number of tradeoffs—development time, accuracy, performance, and more. Ad-hoc instance-specific characterization methods such as dynamic simulation, transistor-level static timing analysis, and divide-and-conquer suffer from multiple limitations that prohibit usage for 40nm technologies and... » read more

IP Market Shifts Direction

By Ed Sperling - 07 May, 2015 - Comments: 0

Semiconductor Engineering sat down to discuss intellectual property changes and challenges with Patrick Soheili, vice president of product management and corporate development at [getentity id="22242" e_name="eSilicon"]; Navraj Nandra, senior director of marketing for DesignWare analog and MSIP at [getentity id="22035" e_name="Synopsys"]; Kurt Shuler, vice president of marketing at [getentity i... » read more

Experts At The Table: Performance Analysis

By Ed Sperling - 28 Jun, 2013 - Comments: 0

Low-Power/High-Performance Engineering sat down with Ravi Kalyanaraman, senior verification manager for the digital entertainment business unit at Marvell; William Orme, strategic marketing manager for ARM’s System IP and Processor Division; Steve Brown, product marketing and business development director for the systems and software group at Cadence; Johannes Stahl director of product market... » read more

Proving IP

By Ed Sperling - 14 Feb, 2013 - Comments: 0

As the amount of commercially available IP in a design increases, so does the level of confusion. Unlike those giant yellow stickers you get with a major appliance that tell you how much energy you’re likely to use over the course of a year and the projected cost range, there’s no such information available for semiconductor IP. In fact, there’s even resistance to provide that kind of ... » read more

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tag: characterization

Speeding Up The R&D Metrology Process

What’s In Your IP?

Cloud Characterization

Challenges In IP Reuse

Next-Generation Liberty Verification And Debugging

NIWeek Test Talk

Addressing Memory Characterization Capacity And Throughput Requirements With Dynamic Partitioning

IP Market Shifts Direction

Experts At The Table: Performance Analysis

Proving IP

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