tag: data analytics

Data Issues Mount In Chip Manufacturing
By Anne Meixner - 09 Feb, 2021 - Comments: 2

For yield management systems the old calculation adage, "garbage in/garbage out" still rings true. Aligning and cleaning data remains a dirty business. With the increased value in data in the semiconductor supply chain, there now are essentially two supply chains running in parallel. One involves the physical product being created, while the other includes the data associated with each proce... » read more

Too Much Fab And Test Data, Low Utilization
By Anne Meixner - 12 Jan, 2021 - Comments: 7

Can there be such a thing as too much data in the semiconductor and electronics manufacturing process? The answer is, it depends. An estimated 80% or more of the data collected across the semiconductor supply chain is never looked at, from design to manufacturing and out into the field. While this may be surprising, there are some good reasons: Engineers only look at data necessary to s... » read more

Using Analytics To Reduce Burn-in
By Anne Meixner - 12 Jan, 2021 - Comments: 3

Silicon providers are using adaptive test flows to reduce burn-in costs, one of the many approaches aimed at stemming cost increases at advanced nodes and in advanced packages. No one likes it when their cell phone fails within the first month of ownership. But the problems are much more pressing when the key components in data warehouse servers or automobiles fail. Reliability expectations ... » read more

Predicting Reliability At 3/2nm And Beyond
By Ed Sperling - 08 Dec, 2020 - Comments: 0

The chip industry is determined to manufacture semiconductors at 3/2nm — and maybe even beyond — but it's unlikely those chips will be the complex all-in-one SoCs that have defined advanced electronics over the past decade or so. Instead, they likely will be one of many tiles in a system that define different functions, the most important of which are highly specialized for a particular app... » read more

Infrastructure Impacts Data Analytics
By Anne Meixner - 08 Dec, 2020 - Comments: 2

Semiconductor data analytics relies upon timely, error-free data from the manufacturing processes, but the IT infrastructure investment and engineering effort needed to deliver that data is, expensive, enormous, and still growing. The volume of data has ballooned at all points of data generation as equipment makers add more sensors into their tools, and as monitors are embedded into the chip... » read more

Silicon Lifecycle Management
By Ed Sperling - 30 Nov, 2020 - Comments: 0

How do you track, measure and ensure reliability over the lifetime of a chip, regardless of how or where it is used? Steve Pateras, senior director of marketing for test products at Synopsys, drills down into the impact of hardware-software co-design, over-the-air updates, the expected lifetime of designs, and how the various monitors and sensors are used to track environmental, structural and ... » read more

Adaptive Test Gains Ground
By Anne Meixner - 10 Nov, 2020 - Comments: 0

Not all devices get tested the same way anymore, and that’s a good thing. Quality, test costs, and yield have motivated product engineers to adopt test processes that fall under the umbrella of adaptive test, which uses test data to modify a subsequent test process. But to execute such techniques requires logistics that support analysis of data, as well as enabling changes to a test based ... » read more

Does HW Vs. SW Choice Affect Quality And Reliability?
By Bryon Moyer - 10 Nov, 2020 - Comments: 0

Electronic systems comprise both hardware and software. Which functions are implemented with hardware and which with software are decisions made based upon a wide variety of considerations, including concerns about quality and reliability. Hardware may intrinsically provide for higher device quality, but it is also the source of reliability concerns. This is in contrast with popular views of... » read more

Why Data Format Slows Chip Manufacturing Progress
By Susan Rambo - 14 Oct, 2020 - Comments: 0

The Standard Test Data Format (STDF), a workhorse data format used to pull test results data from automated test equipment, is running out of steam after 35 years. It is unable to keep up with the explosive increase in data generated by more sensors in various semiconductor manufacturing processes. First developed in 1985 by Teradyne, STDF is a binary format that is translated into ASCII or ... » read more

From Design To Deployment: How Silicon Lifecycle Management Optimizes The Entire IC Life Span
By Steve Pateras - 13 Oct, 2020 - Comments: 0

The beginning of the IC journey gets most of the attention in the semiconductor world – the challenges of design, test and manufacturing. But the reality is the entire lifecycle of a chip needs attention, requiring ways to ensure a chip’s intended and ongoing operation, especially in ever-changing operating environments where chips ultimately reside. The growing complexity of today’s e... » read more

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