The Third Generation Of FPGA Prototyping


Bench setups with physical prototypes lie at the very heart of electrical and electronic engineering. With all due respect to the many powerful forms of modeling and simulation, at some point the engineering team wants to work with hardware. When a system is built entirely from existing components, it is possible to build a prototype of the product as soon as it has been designed. When the desi... » read more

Improving Volume Diagnosis and Debug with Test Failure Clustering and Reorganization


Abstract: "Volume diagnosis and debug play a key role in identifying systematic test failures caused by manufacturing defectivity, design marginalities, and test overkill. However, diagnosis tools often suffer from poor diagnosis resolution. In this paper, we propose techniques to improve diagnosis resolution by test failure clustering and reorganization. The effectiveness of our techniques ... » read more

Gaps In The AI Debug Process


When an AI algorithm is deployed in the field and gives an unexpected result, it's often not clear whether that result is correct. So what happened? Was it wrong? And if so, what caused the error? These are often not simple questions to answer. Moreover, as with all verification problems, the only way to get to the root cause is to break the problem down into manageable pieces. The semico... » read more

Two Methods For Debugging SW Workloads On Arm-Based SoCs


By Andy Meier and Tomasz Piekarz In a typical system-on-a-chip (SoC) development project, chip architects will make a given SoC's initial specification available to design teams years in advance of the silicon. As requirements change, they will modify both the hardware and software specifications. Typically, a large portion of the software development occurs much later in the development pro... » read more

Debugging Embedded Applications


Debugging embedded designs is becoming increasingly difficult as the number of observed and possible interactions between hardware and software continue to grow, and as more features are crammed into chips, packages, and systems. But there also appear to be some advances on this front, involving a mix of techniques, including hardware trace, scan chain-based debug, along with better simulation ... » read more

Debug Solutions For Designers Accelerate Time To Verification


Complexity continues to explode as designs become larger and more complicated with more functionality and more aggressive expectations. The cost of doing business as usual, for the entire design and verification team, in turn, grows exponentially, in terms of time, effort, and dollars. Fig. 1: Discovering issues later than possible requires more effort to find and fix. (Source: Wilson Rese... » read more

Four Requirements To Improve Chip Design Debug


Debug has always been a painful and unavoidable part of semiconductor design and, despite many technological advances, it remains one of the dominant tasks in chip development. At one time, most bugs were detected and diagnosed on actual devices in the bring-up lab, where both visibility and controllability are severely limited. It is certainly true that debugging the results from pre-silicon t... » read more

Easing The Burden Of Early Bug Detection


Integrated circuit designers are under constant pressure to deliver bug free code that meets ever more rigorous requirements. It is well known that the more bugs that can be detected early in the development process, the faster and easier that development effort will be. However, early bug detection requires a verification overhead on the designer that can be onerous and impact the design proce... » read more

Beyond Bug Hunting: Verification Coverage From Safety To Certification


Understanding verification coverage is critical for meeting IC integrity standards and goes well beyond detecting bugs in the design. Without proper verification coverage metrics, meeting strict safety standards and certification may not be achievable. Precise metrics indicate where there are gaps in verification and provide a clear view of the progress being made in the verification effort. Co... » read more

Lower Power Chips: What To Watch Out For


Low-power design in advanced nodes and advanced packaging is becoming a multi-faceted, multi-disciplinary challenge, where a long list of issues need to be solved both individually and in the context of other issues. With each new leading-edge process node, and with increasingly dense packaging, the potential for problematic interactions is growing. That, in turn, can lead to poor yield, cos... » read more

← Older posts Newer posts →