How To Improve Analog Design Reuse


Digital circuit design is largely automated today, but most analog components still are designed manually. This may change soon. As analog design grows increasingly complex and error-prone, design teams and tool vendors are focusing on how to automate as much of the design of analog circuits as possible. Analog design is notoriously difficult and varied. It can include anything from power ma... » read more

Why Chips Die


Semiconductor devices contain hundreds of millions of transistors operating at extreme temperatures and in hostile environments, so it should come as no surprise that many of these devices fail to operate as expected or have a finite lifetime. Some devices never make it out of the lab and many others die in the fab. It is hoped that most devices released into products will survive until they be... » read more

Taming NBTI To Improve Device Reliability


Negative-bias temperature instability is a growing issue at the most advanced process nodes, but it also has proven extremely difficult to tame using conventional approaches. That finally may be starting to change. NBTI is an aging mechanism in field-effect transistors that leads to a change of the characteristic curves of a transistor during operation. The result can be a drift toward unint... » read more

Week In Review: Manufacturing, Test


Chipmakers GlobalFoundries has announced the addition of nine new partners to its RFwave Partner Program, including AkronIC, Ask Radio, Catena, University of Waterloo Centre for Intelligent Antenna and Radio Systems (CIARS), Giga Solution, Helic, Incize, Mentor Graphics and Xpeedic Technology. The RFwave Partner Program builds upon GF’s radio-frequency (RF) efforts. The new partners will pro... » read more

Power Delivery Affecting Performance At 7nm


Complex interactions and dependencies at 7nm and beyond can create unexpected performance drops in chips that cannot always be caught by signoff tools. This isn't for lack of effort. The amount of time spent trying to determine if an advanced-node chip will work after it is fabricated has been rising steadily for several process nodes. Additional design rules handle everything from variation... » read more

Parametric Analysis, Design Guidelines for mm-Wave nm CMOS Transmission Lines


This paper focuses on nm CMOS transmission line design as distributed passive elements and their application in mm-wave integrated circuits. A variety of transmission lines such as coplanar waveguides (CPWs), shielded coplanar waveguides (SCPWs), and CPW with ground are analyzed in terms of their geometry and electrical properties. The parametric analysis of the various line types is based on a... » read more

Electromagnetic Analysis and Signoff: Cost Savings


By Nikolas Provatas and Magdy Abadir We are often asked by SoC design teams about the benefits of an electromagnetic analysis and signoff methodology. Here is an overview of some of the big “cost savings”. Time to Market Savings Utilizing an EM crosstalk analysis and signoff methodology provides designers with an “insurance policy” against the risk of EM coupling in their SOC des... » read more

Aging In Advanced Nodes


Semiconductor Engineering sat down to discuss design reliability and circuit aging with João Geada, chief technologist for the semiconductor business unit at ANSYS; Hany Elhak, product management director, simulation and characterization in the custom IC and PCB group at Cadence; Christoph Sohrmann, advanced physical verification at Fraunhofer EAS; Magdy Abadir, vice president of marketing at ... » read more

Enabling Cheaper Design


While the EDA industry tends to focus on cutting edge designs, where design costs are a minor portion of the total cost of product, the electronics industry has a very long tail. The further along the tail you go, the more significant design costs become as a percent of total cost. Many of those designs are traditionally built using standard parts, such as microcontrollers, but as additional... » read more

Process Corner Explosion


The number of corners that need to be checked is exploding at 7nm and below, fueled by everything from temperature and voltage to changes in metal. Lowering risk and increasing predictability of an SoC at those nodes starts with understanding what will happen when a design is manufactured on a particular foundry process, captured in process corners. This is basically a way of modeling what i... » read more

← Older posts