Designing 5G Chips


5G is the wireless technology of the future, and it’s coming fast. The technology boasts very high-speed data transfer rates, much lower latency than 4G LTE, and the ability to handle significantly higher densities of devices per cell site. In short, it is the best technology for the massive amount of data that will be generated by sensors in cars, IoT devices, and a growing list of next-g... » read more

IP Electromagnetic Crosstalk Requires Contextual Signoff


By Magdy Abadir and Anand Raman Continuous advancement in technology scaling is enabling the emergence of high-performance application markets such as artificial intelligence, autonomous cars and 5G communication. These electronic systems operate at multi-GHz speed, while consuming the lowest amount of power possible leaving very little margin for error. Chips in these systems are highly in... » read more

High-Performance Memory Challenges


Designing memories for high-performance applications is becoming far more complex at 7/5nm. There are more factors to consider, more bottlenecks to contend with, and more tradeoffs required to solve them. One of the biggest challenges is the sheer volume of data that needs to be processed for AI, machine learning or deep learning, or even in classic data center server racks. “The design... » read more

Tech Talk: 7/5/3nm Signoff


Anand Raman, director of technical marketing at Helic, explains what's needed to improve confidence in designs at the most advanced process nodes. https://youtu.be/2O2pbMJSta4 » read more

New Shifts In Automotive Design


Four big shifts in automotive design and usage are beginning to converge—electrification, increasing connectivity, autonomous driving and car sharing—creating a ripple effect across the automotive electronics supply chain. Over the past few years the electronic content of cars and other vehicles has surged, with electrical systems replacing traditional mechanical and electro-mechanical s... » read more

Why Inductance Is Good for Area, Power and Performance


By Magdy Abadir and Yehea Ismail For chips designed at advanced technology nodes, interconnect is the dominant contributor towards delay, power consumption, and reliability. Major interconnects such as clock trees, power distribution networks and wide buses play a significant role in chip failure mechanisms such as jitter, noise coupling, power distribution droops, and electro-migration. ... » read more

New Issues In Advanced Packaging


Advanced packaging is gaining in popularity as the cost and complexity of integrating everything onto a planar SoC becomes more difficult and costly at each new node, but ensuring that these packaged die function properly and yield sufficiently isn't so simple. There are a number of factors that are tilting more of the the semiconductor industry toward advanced [getkc id="27" kc_name="packag... » read more

Symptoms Of SoC Electromagnetic (EM) Crosstalk


By Anand Raman and Magdy Abadir Have you ever had your silicon demonstrate unexpected behavior? Have you ever found unexplainable design failure or performance degradation? A number of issues could be the culprit - from overloaded signal nets, a noisy power grid, or increasing temperature - but one problem often overlooked is electromagnetic (EM) crosstalk. Electromagnetic (EM) crosstal... » read more

Chip Aging Accelerates


Reliability is becoming an increasingly important proof point for new chips as they are rolled out in new markets such as automotive, cloud computing and industrial IoT, but actually proving that a chip will function as expected over time is becoming much more difficult. In the past, reliability generally was considered a foundry issue. Chips developed for computers and phones were designed ... » read more

New Thermal Issues Emerge


Thermal monitoring is becoming more critical as gate density continues to increase at each new node and as chips are developed for safety critical markets such as automotive. This may sound counterintuitive because the whole point of device scaling is to increase gate density. But at 10/7 and 7/5nm, static current leakage is becoming a bigger issue, raising questions about how long [getkc id... » read more

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