Chip Industry Technical Paper Roundup: July 16


New technical papers recently added to Semiconductor Engineering’s library. [table id=244 /] More ReadingTechnical Paper Library home   » read more

Technical Paper Roundup: Sept 11


New technical papers added to Semiconductor Engineering’s library this week. [table id=136 /] (more…) » read more

The Utility Of Shallow Dynamic Circuits For Long-Range Entanglement On Large-Scale Quantum Devices


A technical paper titled “Efficient Long-Range Entanglement using Dynamic Circuits” was published by researchers at IBM Research, IBM T.J. Watson Research Center, University of Southern California, MIT-IBM Watson AI Lab, and IBM Quantum. Abstract: "Quantum simulation traditionally relies on unitary dynamics, inherently imposing efficiency constraints on the generation of intricate entangl... » read more

Technical Paper Roundup: Sept 5


New technical papers added to Semiconductor Engineering’s library this week. [table id=132 /] (more…) » read more

How A Fault-Tolerant Quantum Memory Could Be Realized Using Near-Term Quantum Processors With Small Qubit Overhead


A technical paper titled “High-threshold and low-overhead fault-tolerant quantum memory” was published by researchers at IBM T.J. Watson Research Center and MIT-IBM Watson AI Lab. Abstract: "Quantum error correction becomes a practical possibility only if the physical error rate is below a threshold value that depends on a particular quantum code, syndrome measurement circuit, and a decod... » read more

Formally Modeling A Security Monitor For Virtual Machine-Based Confidential Computing Systems (IBM)


A technical paper titled “Towards a Formally Verified Security Monitor for VM-based Confidential Computing” was published by researchers at IBM Research and IBM T.J. Watson Research Center. Abstract: "Confidential computing is a key technology for isolating high-assurance applications from the large amounts of untrusted code typical in modern systems. Existing confidential computing syste... » read more

FEOL Nanosheet Process Flow & Challenges Requiring Metrology Solutions (IBM Watson)


New technical paper titled "Review of nanosheet metrology opportunities for technology readiness," from researchers at IBM Thomas J. Watson Research Ctr. (United States). Abstract (partial): "More than previous technologies, then, nanosheet technology may be when some offline techniques transition from the lab to the fab, as certain critical measurements need to be monitored in real time. T... » read more

Technical Paper Round-up: June 14


New technical papers added to Semiconductor Engineering’s library this week. [table id=33 /] Semiconductor Engineering is in the process of building this library of research papers. Please send suggestions (via comments section below) for what else you’d like us to incorporate. If you have research papers you are trying to promote, we will review them to see if they are a good fit f... » read more

Synchrotron S-ray Diffraction-based Non-destructive Nanoscale Mapping of Si/SiGe Nanosheets for GAA structures


New research paper titled "Mapping of the mechanical response in Si/SiGe nanosheet device geometries" from researchers at IBM T.J. Watson Research Center and Brookhaven National Laboratory. Sponsored by U.S. DOE. Abstract "The performance of next-generation, nanoelectronic devices relies on a precise understanding of strain within the constituent materials. However, the increased flexibilit... » read more