tag: IR drop

5nm Design Progress
By Ann Mutschler - 17 Jul, 2018 - Comments: 1

Activity surrounding the 5nm manufacturing process node is quickly ramping, creating a better picture of the myriad and increasingly complex design issues that must be overcome. Progress at each new node after 28nm has required an increasingly tight partnership between the foundries, which are developing new processes and rule decks, along with EDA and IP vendors, which are adding tools, met... » read more

In-Design Power Rail Analysis
By Ed Sperling - 17 Jul, 2018 - Comments: 0

Tech Talk: Kenneth Chang, senior staff product marketing manager at Synopsys, talks about what can go wrong with power at advanced nodes and why in-design power rail analysis works best early in the flow in helping to reduce overall margin. https://youtu.be/0oiWQPS1-Xk » read more

Supply Monitoring On 28nm & FinFET: The Challenges Posed
By Ramsay Allen - 12 Apr, 2018 - Comments: 0

A Q&A with Moortec CTO Oliver King. What are the issues with supplies on advanced nodes? The supplies have been coming down, quicker than the threshold voltages which has led to less supply margin. In addition to this, the interconnects are becoming thinner and closer together, which is pushing up resistance and also capacitance. What is the effect of these issues? In short, it... » read more

New Power Concerns At 10/7nm
By Ann Mutschler - 16 Oct, 2017 - Comments: 1

As chip sizes and complexity continues to grow exponentially at 7nm and below, managing power is becoming much more difficult. There are a number of factors that come into play at advanced nodes, including more and different types of processors, more chip-package decisions, and more susceptibility to noise of all sorts due to thinner insulation layers and wires. The result is that engineers ... » read more

Addressing Power Integrity Challenges For SoCs
By Synopsys - 11 Oct, 2017 - Comments: 0

Power integrity has become a crucial part of the system-on-a-chip (SoC) design flow because power-related issues can affect chip timing and even lead to complete device failure. Specifically, excessive rail voltage drop (IR-drop) and ground bounce can create timing problems and electromigration effects that impact a chip's performance and reliability. Analyzing a chip's power also poses diff... » read more

Worst-Case Results Causing Problems
By Ed Sperling - 09 Mar, 2017 - Comments: 0

The ability of design tools to identify worst-case scenarios has allowed many chipmakers to flag potential issues well ahead of tapeout, but as process geometries shrink that approach is beginning to create its own set of issues. This is particularly true at 16/14nm and below, where extra circuitry can slow performance, boost the amount of power required to drive signals over longer, thinne... » read more

Routing Signals At 7nm
By Ed Sperling - 09 Feb, 2017 - Comments: 0

[getperson id="11763" comment="Tobias Bjerregaard"], [getentity id="22908" e_name="Teklatech's"] CEO, discusses the challenges of designs at 7nm and beyond, including power integrity, how to reduce IR drop and timing issues, and how to improve the economics of scaling. SE: How much further can device scaling go? Bjerregaard: The way you should look at this is [getkc id="74" comment="Moore... » read more

Closing The Power Integrity Gap
By Ann Mutschler - 19 Oct, 2016 - Comments: 0

Voltage drop has always been a significant challenge. As far back as 130nm, specialist tools were being used to ensure that enough local decoupling capacitance (decap) cells were inserted in addition to larger decaps implemented around the SoC. But advanced nodes are complicating matters and further increasing complexity. These technological challenges, which underlie the power, performance ... » read more

Analyzing The Integrity Of Power
By Ann Mutschler - 14 Apr, 2016 - Comments: 0

Power analysis is shifting much earlier in the chip design process, with power emerging as the top design constraint at advanced process nodes. As engineering teams pack more functionality and content into bigger and more complex chips, they are having to deal with more complex interactions that affect everything from power to its impact on signal integrity and long-term reliability. That, i... » read more

Accurate Thermal Analysis, Including Thermal Coupling Of On-Chip Hot Interconnect
By Norman Chang - 15 Oct, 2015 - Comments: 0

Driven by rapid advancement in mobile/server computing and automotive/communications, SoCs are experiencing a fast pace of functional integration along with technology scaling. Advanced low power techniques are widely used, while meeting higher performance requirements using a variety of packaging technologies. The Internet of Things (IoT) is further opening up new applications with connected d... » read more

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