Modeling Effects Of Fluctuation Sources On Electrical Characteristics Of GAA Si NS MOSFETs Using ANN-Based ML


Researchers from National Yang Ming Chiao Tung University (Taiwan) published a technical paper titled "A Machine Learning Approach to Modeling Intrinsic Parameter Fluctuation of Gate-All-Around Si Nanosheet MOSFETs." "This study has comprehensively analyzed the potential of the ANN-based ML strategy in modeling the effect of fluctuation sources on electrical characteristics of GAA Si NS MOSF... » read more

Deep Learning To Classify And Establish Structure Property Predictions With PeakForce QNM Atomic Force Microscopy


Machine learning and specifically, deep learning, is a powerful tool to establish the presence (or absence) of microstructure correlations to bulk properties with its ability to flesh out relationships and trends that are difficult to establish otherwise. This application note discusses the use of deep learning tools, to explore AFM phase and PeakForce Quantitative Nanomechanics (QNM) im... » read more

Methods To Overcome Limited Labeled Data Sets In Machine Learning-Based Optical Critical Dimension Metrology


With the aggressive scaling of semiconductor devices, the increasing complexity of device structure coupled with tighter metrology error budget has driven up Optical Critical Dimension (OCD) time to solution to a critical point. Machine Learning (ML), thanks to its extremely fast turnaround, has been successfully applied in OCD metrology as an alternative solution to the conventional physical... » read more

Artificial Neural Network (ANN)-Based Model To Evaluate The Characteristics of A Nanosheet FET (NSFET)


This new technical paper titled "Machine-Learning-Based Compact Modeling for Sub-3-nm-Node Emerging Transistors" was published by researchers at SungKyunKwan University, Korea. Abstract: "In this paper, we present an artificial neural network (ANN)-based compact model to evaluate the characteristics of a nanosheet field-effect transistor (NSFET), which has been highlighted as a next-generat... » read more

ML Architecture for Solving the Inverse Problem for Matter Wave Lithography: LACENET


This recent technical paper titled "Realistic mask generation for matter-wave lithography via machine learning" was published by researchers at University of Bergen (Norway). Abstract: "Fast production of large area patterns with nanometre resolution is crucial for the established semiconductor industry and for enabling industrial-scale production of next-generation quantum devices. Metasta... » read more

ML-Based Framework for Automatically Generating Hardware Trojan Benchmarks


A new technical paper titled "Automatic Hardware Trojan Insertion using Machine Learning" was published by researchers at University of Florida and Stanford University. Abstract (partial): "In this paper, we present MIMIC, a novel AI-guided framework for automatic Trojan insertion, which can create a large population of valid Trojans for a given design by mimicking the properties of a small... » read more

Machine Learning-Driven Full-Flow Chip Design Automation


To enable the semiconductor industry to continue growing, the chip design process must become more efficient. With the availability of massive, cloud-enabled, distributed computing and advancements in machine learning computer science, the next chip design automation revolution is now possible. The Cadence® Cerebrus™ Intelligent Chip Explorer utilizes both of these technologies, based o... » read more

Techniques For Improving Energy Efficiency of Training/Inference for NLP Applications, Including Power Capping & Energy-Aware Scheduling


This new technical paper titled "Great Power, Great Responsibility: Recommendations for Reducing Energy for Training Language Models" is from researchers at MIT and Northeastern University. Abstract: "The energy requirements of current natural language processing models continue to grow at a rapid, unsustainable pace. Recent works highlighting this problem conclude there is an urgent need ... » read more

New Uses For AI In Chips


Artificial intelligence is being deployed across a number of new applications, from improving performance and reducing power in a wide range of end devices to spotting irregularities in data movement for security reasons. While most people are familiar with using machine learning and deep learning to distinguish between cats and dogs, emerging applications show how this capability can be use... » read more

Assessing & Simulating Semiconductor Side-Channel or Unintended Data Leakage Vulnerabilities


This research paper titled "Multiphysics Simulation of EM Side-Channels from Silicon Backside with ML-based Auto-POI Identification" from researchers at Ansys, National Taiwan University and Kobe University won the best paper award at IEEE's International Symposium on Hardware Oriented Security and Trust (HOST). The paper presents a new tool "to assess unintended data leakage vulnerabilities... » read more

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