How And Where ML Is Being Used In IC Manufacturing


Semiconductor Engineering sat down to discuss the issues and challenges with machine learning in semiconductor manufacturing with Kurt Ronse, director of the advanced lithography program at Imec; Yudong Hao, senior director of marketing at Onto Innovation; Romain Roux, data scientist at Mycronic; and Aki Fujimura, chief executive of D2S. What follows are excerpts of that conversation. Part one ... » read more

What Machine Learning Can Do In Fabs


Semiconductor Engineering sat down to discuss the issues and challenges with machine learning in semiconductor manufacturing with Kurt Ronse, director of the advanced lithography program at Imec; Yudong Hao, senior director of marketing at Onto Innovation; Romain Roux, data scientist at Mycronic; and Aki Fujimura, chief executive of D2S. What follows are excerpts of that conversation. L-R:... » read more

Memory Issues For AI Edge Chips


Several companies are developing or ramping up AI chips for systems on the network edge, but vendors face a variety of challenges around process nodes and memory choices that can vary greatly from one application to the next. The network edge involves a class of products ranging from cars and drones to security cameras, smart speakers and even enterprise servers. All of these applications in... » read more

Week In Review: Auto, Security, Pervasive Computing


National Instruments is offering free online training courses to anyone anywhere, until the end of April to help support the engineering community during COVID-19 crisis. Some instructor-led virtual training is available at reduced cost. NIWeek has been postponed this year until August 3-5, 2020. Click here for more news about how the semiconductor industry is handling COVID-19. AI, machi... » read more

HBM2E Memory: A Perfect Fit For AI/ML Training


Artificial Intelligence/Machine Learning (AI/ML) growth proceeds at a lightning pace. In the past eight years, AI training capabilities have jumped by a factor of 300,000 (10X annually), driving rapid improvements in every aspect of computing hardware and software. Memory bandwidth is one such critical area of focus enabling the continued growth of AI. Introduced in 2013, High Bandwidth Memo... » read more

Power Challenges In ML Processors


The design of artificial intelligence (AI) chips or machine learning (ML) systems requires that designers and architects use every trick in the book and then learn some new ones if they are to be successful. Call it style, call it architecture, there are some designs that are just better than others. When it comes to power, there are plenty of ways that small changes can make large differences.... » read more

Machine Learning At The Edge


Moving machine learning to the edge has critical requirements on power and performance. Using off-the-shelf solutions is not practical. CPUs are too slow, GPUs/TPUs are expensive and consume too much power, and even generic machine learning accelerators can be overbuilt and are not optimal for power. In this paper, learn about creating new power/memory efficient hardware architectures to meet n... » read more

AI Roadmap: A human-centric approach to AI in aviation


Source: EASA European Union Aviation Safety Agency February 2020 "EASA published its Artificial Intelligence Roadmap 1.0 which establishes the Agency’s initial vision on the safety and ethical dimensions of development of AI in the aviation domain. The AI Roadmap 1.0 is to be viewed as a starting point, intended to serve as a basis for discussion with the Agency’s stakeholders. It... » read more

High-Performance Memory For AI And HPC


Frank Ferro, senior director of product management at Rambus, examines the current performance bottlenecks in high-performance computing, drilling down into power and performance for different memory options, and explains what are the best solutions for different applications and why. » read more

Degradation Monitoring


This paper describes a reliability degradation modeling and monitoring method based on a combination of IC novel embedded circuits (Agents), and off-chip machine learning algorithms which infer the digital readouts of these circuits during test and operational lifetime. Together, they monitor the margin degradation of an IC, as well as other vital parameters of the IC and its environmental s... » read more

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