tag: Mentor

Leveraging Chip Data To Improve Productivity
By Ann Mutschler - 23 Feb, 2023 - Comments: 1

The semiconductor ecosystem is scrambling to use data more effectively in order to increase the productivity of design teams, improve yield in the fab, and ultimately increase reliability of systems in the field. Data collection, analysis, and utilization is at the center of all these efforts and more. Data can be collected at every point in the design-through-manufacturing flow and into the f... » read more

Dealing With Performance Bottlenecks In SoCs
By Brian Bailey - 23 Feb, 2023 - Comments: 0

A surge in the amount of data that SoCs need to process is bogging down performance, and while the processors themselves can handle that influx, memory and communication bandwidth are straining. The question now is what can be done about it. The gap between memory and CPU bandwidth — the so-called memory wall — is well documented and definitely not a new problem. But it has not gone away... » read more

Fast, Focused Early-Stage Circuit Verification Can Get You To Signoff Faster
By Kesmat Shahin - 23 Feb, 2023 - Comments: 0

Designers everywhere know that with the increasing complexity of integrated circuits (ICs), meeting tapeout schedules has become increasingly difficult. While there are often many reasons for missing tapeouts, one critical component is the significant amount of time needed to run the signoff layout verification cycle, which contributes to overall signoff process duration. Much of this schedule ... » read more

Achieve Dramatic Productivity And Turnaround Time Improvements In Early Design Electrical Rule Checking
By Siemens EDA - 22 Feb, 2023 - Comments: 0

Early-stage layout vs. schematic (LVS) and circuit verification typically return large numbers of connectivity errors, which can be a critical bottleneck for both LVS and physical verification flows that require correct connectivity for valid results. The Calibre nmLVS Recon tool targets essential and relevant early-stage circuit verification pain points, such as electrical rule checking (ERC) ... » read more

Blog Review: Feb. 22
By Jesse Allen - 22 Feb, 2023 - Comments: 0

Siemens EDA's Harry Foster observes that the FPGA market continues to go through a similar complexity curve that the IC/ASIC market experienced in the early and mid-2000 timeframe. Synopsys' Mitch Heins explores the benefits of heterogeneous integration of lasers and active gain elements in a silicon-based photonic IC, including reduced system costs, size, weight, and power along with improv... » read more

Week In Review: Design, Low Power
By Linda Christensen - 17 Feb, 2023 - Comments: 0

It’s earnings season. Arm, Cadence, Synopsys, Siemens (consolidated), Rambus, and Renesas reported quarterly results over the past couple weeks. All posted year-over-year revenue growth, despite an overall challenging macroeconomic climate. A roundup of all the chip industry earnings reports from the past several weeks can be found here. The edge computing market is projected to jump to al... » read more

Managing Thermal-Induced Stress In Chips
By Karen Heyman - 16 Feb, 2023 - Comments: 0

At advanced nodes and in the most advanced packages, physics is no one's friend. Escalating density, smaller features, and thinner dies make it more difficult to dissipate heat, and they increase mechanical stress. On the flip side, thinner dielectrics and tighter spaces make it more difficult to insulate and protect against that heat, and in conjunction with those smaller features and higher d... » read more

Blog Review: Feb. 15
By Jesse Allen - 15 Feb, 2023 - Comments: 0

Siemens EDA's Harry Foster examines the relationship between verification maturity and non-trivial bug escapes into production, as well as whether safety critical development processes yield higher quality in terms of preventing bugs and achieving silicon success. Synopsys' Shankar Krishnamoorthy finds that the rapid progress of machine learning models is driving demand for more domain-speci... » read more

Chiplets Taking Root As Silicon-Proven Hard IP
By Ann Mutschler - 09 Feb, 2023 - Comments: 0

Chiplets are all the rage today, and for good reason. With the various ways to design a semiconductor-based system today, IP reuse via chiplets appears to be an effective and feasible solution, and a potentially low-cost alternative to shrinking everything to the latest process node. To enable faster time to market, common IP or technology that already has been silicon-proven can be utilized... » read more

Everything, Everywhere, All At Once: Big Data Reimagines Verification Predictability And Efficiency
By Darron May - 09 Feb, 2023 - Comments: 0

Big data is a term that has been around for many years. The list of applications for big data are endless, but the process stays the same: capture, process and analyze. With new, enabling verification solutions, big data technologies can improve your verification process efficiency and predict your next chip sign-off. By providing a big data infrastructure, with state-of-the-art technologies... » read more

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