Abstract Verification


Verification relies on a separation of concerns. Otherwise the task has no end. Sometimes we do it without thinking, but as an industry, we have never managed to fully define it such that it can become an accepted and trusted methodology. This becomes particularly true when we bring abstraction into the picture. A virtual prototype is meant to be true to behavior, but there could be timing d... » read more

IP Management And Development At 5/3nm


The growing complexity of moving to new process nodes is making it much more difficult to create, manage and re-use IP. There are more rules, more data to manage, and more potential interactions as density increases, both in planar implementations and in advanced packaging. And the problems only get worse as designs move to 5nm and 3nm, and as more heterogeneous components such as accelerato... » read more

Seeing Is Believing: Visualizing Full Coverage Closure In Low-Power Designs


By Madhur Bhargava and Durgesh Prasad Lowering the power consumption and leakage in SoCs and other electrical designs has become a paramount concern in recent years. The reasons for this are many and well understood. The structures and techniques we use to accomplish this have made verification of so called low-power designs more complex and difficult than it is for designs where power usage... » read more

The Single Best DFT Move You Can Make


A proven method to simplify a complex problem is to break it into smaller chunks. In the case of today’s large, complex SoCs, this means using hierarchical methods to design the blocks, then combine the results at the top level. While this sounds obvious, it hasn’t always been practical or technologically feasible to perform some tasks, like DFT, at the block level and translate that work s... » read more

Boosting Analog Reliability


Aveek Sarkar, vice president of Synopsys’ Custom Compiler Group, talks about challenges with complex design rules, rigid design methodologies, and the gap between pre-layout and post-layout simulation at finFET nodes. https://youtu.be/JRYlYJ31LLw » read more

Boosting Regression Throughput By Reusing Setup Phase Simulation


This paper discusses how to write a design so the common initial setup phase simulation is done once and then used as a foundation to run different tests later on, including the ability to change test stimulus to simulate different test behaviors. It also discusses what type of designs are appropriate for this methodology and what a designer can do to make his/her design suitable for it. Also c... » read more

Tech Talk: 7nm Process Variation


Ankur Gupta, director of field applications at ANSYS, discusses process variation and the problems it can cause at 10/7nm and beyond. https://youtu.be/WHNjFr1Da6s » read more

Visual Design Diff


A document, whether it is stored as a simple text file or as a word processor formatted file, is often a living entity that is constantly evolving. A user may create a first draft, revise it multiple times, have other team members review it and make alterations, and refine it over time to keep up with new information and requirements. What has changed since the last revision becomes very import... » read more

Challenges Grow For IP Reuse


As chip complexity increases, so does the complexity of IP blocks being developed for those designs. That is making it much more difficult to re-use IP from one design to the next, or even to integrate new IP into an SoC. What is changing is the perception that standard [getkc id="43" kc_name="IP"] works the same in every design. Moreover, well-developed [getkc id="100" kc_name="methodologie... » read more

Why Auto Designs Take So Long


Designing chips for the automotive market is adding significant overhead, particularly for chips with stringent safety requirements. On the verification side it could result in an additional 6 to 12 months of work. On the design side, developing the same processor in the mobile market would take 6 fewer man months. And when it comes to complex electronic control units (ECUs) or [getkc id="81... » read more

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