tag: mixed signal

Brute-Force Analysis Not Keeping Up With IC Complexity
By Brian Bailey - 24 Nov, 2020 - Comments: 0

Much of the current design and verification flow was built on brute force analysis, a simple and direct approach. But that approach rarely scales, and as designs become larger and the number of interdependencies increases, ensuring the design always operates within spec is becoming a monumental task. Unless design teams want to keep adding increasing amounts of margin, they have to locate th... » read more

Mixed-Signal Methodologies: Data Management
By Cliosoft - 04 Nov, 2020 - Comments: 0

Software teams have long used version control and data management systems and they have become an integral part of a software development environment. Practically, no significant software project is started without a software data management system and methodology in place. There are a variety of solutions, typically referred to as Software Configuration Management (SCM) systems, to choose from... » read more

Increase In Analog Problems
By Brian Bailey - 19 Oct, 2020 - Comments: 6

Analog and mixed signal design has always been tough, but a resent survey suggests that the industry has seen significantly increased failures in the past year because the analog circuitry within an ASIC was out of tolerance. What is causing this spike in failures? Is it just a glitch in the data, or are these problems real? The answer is complicated, and to a large extent it depends heavily... » read more

Problems And Solutions In Analog Design
By Ann Mutschler - 05 Aug, 2020 - Comments: 1

Advanced chip design is becoming a great equalizer for analog and digital at each new node. Analog IP has more digital circuitry, and digital designs are more susceptible to kinds of noise and signal disruption that have plagued analog designs for years. This is making the design, test and packaging of SoCs much more complicated. Analog components cause the most chip production test failures... » read more

Ins And Outs Of In-Circuit Monitoring
By Ed Sperling - 21 Jul, 2020 - Comments: 2

At 7nm and 5nm, in-circuit monitoring is becoming essential. Steve Crosher, CEO of Moortec, talks about the impact of rising complexity, how different use cases and implementations can affect reliability and uptime, and why measuring electrical, voltage and thermal stress can be used to statistically predict failures and improve reliability throughout a chip’s lifetime. » read more

Fast And Accurate Variation-Aware Mixed-Signal Verification Of Time-Domain 2-Step ADC
By Mentor, a Siemens Business - 08 Jul, 2020 - Comments: 0

To meet today’s analog-to-digital converter (ADC) specifications and to produce a high-yield design, teams typically need to perform extensive brute force mixed-signal simulations to account for all potential design variation. However, at nanometer nodes, the number of process, voltage and temperature (PVT) corners and parametric variation grow exponentially making the simulation impractical ... » read more

IC Test Solutions For The Automotive Market
By Mentor, a Siemens Business - 06 May, 2020 - Comments: 0

The amount of electronic content in passenger cars continues to grow rapidly, driven mainly by the integration of various advanced safety features, which will increase further with the move towards fully autonomous vehicles. It is critical that these safety-related devices adhere to the highest possible quality and reliability requirements formalized in the ISO 26262 standard that is being rapi... » read more

Improving Test Coverage And Eliminating Test Ecapes Using Analog Defect Analysis
By Cadence - 06 May, 2020 - Comments: 0

While the analog and mixed-signal components are the leading source of test escapes that result in field failures, the lack of tools to analyze the test coverage during design has made it difficult for designers to address the issue. In this white paper, we explore the methodology for performing analog fault simulation of test coverage based on defect-oriented testing. In addition, we look at h... » read more

More Multiply-Accumulate Operations Everywhere
By Ed Sperling - 02 Apr, 2020 - Comments: 1

Geoff Tate, CEO of Flex Logix, sat down with Semiconductor Engineering to talk about how to build programmable edge inferencing chips, embedded FPGAs, where the markets are developing for both, and how the picture will change over the next few years. SE: What do you have to think about when you're designing a programmable inferencing chip? Tate: With a traditional FPGA architecture you ha... » read more

From Constraints to Tape-Out: Towards A Continuous AMS Design Flow
By Fraunhofer IIS/EAS - 15 Jul, 2019 - Comments: 0

The effort in designing analog/mixed-signal (AMS) integrated circuits is characterized by the largely manual work involved in the design of analog cells and their integration into the overall circuit. This inequality in effort between analog and digital cells increases with the use of modern, more complex technology nodes. To mitigate this problem, this paper presents four methods to improve ex... » read more

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