tag: National Instruments

Using Better Data To Shorten Test Time
By Ed Sperling - 06 Aug, 2019 - Comments: 1

The combination of machine learning plus more sensors embedded into IC manufacturing equipment is creating new possibilities for more targeted testing and faster throughput for fabs and OSATs. The goal is to improve quality and reduce the cost of manufacturing complex chips, where time spent in manufacturing is ballooning at the most advanced nodes. As the number of transistors on a die incr... » read more

Advanced Features Of High-Speed Digital I/O devices: Hardware Compare
By NI - 05 Aug, 2019 - Comments: 0

This paper describes how to use Hardware compare on the NI-HSDIO devices. The hardware compare feature allows users to perform digital comparisons of data on device itself. This allows for real time hardware comparison, which is not possible if data is transferred back to the host computer. This allows for tests such as Bit Error Rate Testing (BERT) and digital waveform comparisons. To read ... » read more

Week In Review: Manufacturing, Test
By Mark LaPedus - 02 Aug, 2019 - Comments: 0

Trade wars Talks between the United States and China continue to stall and the two nations are still embroiled in a trade war. So this week, U.S. President Donald Trump would like to impose a 10% tariff on the remaining $300 billion list of China-based imports starting Sept. 1, according to a report from Reuters. This in turn will impact the electronics and IC industries. In response to the... » read more

Solving 5G’s Thorniest Issues
By Ed Sperling - 01 Aug, 2019 - Comments: 0

5G rollouts are beginning to hit the market, accompanied by a long list of unsolved technical and business issues surrounding this next-generation wireless technology. But progress is being made on some of the key challenges facing this technology, even though not all of those solutions will be in place at launch. The real challenges are with millimeter-wave implementations of 5G, which oper... » read more

Blog Review: July 31
By Jesse Allen - 31 Jul, 2019 - Comments: 0

Cadence's Meera Collier checks out a study that uses AI and natural language processing techniques to infer new discoveries in materials science from published academic literature and considers how it could be used in the future. Synopsys' Taylor Armerding considers whether the NIST Secure Software Development Framework, the latest standard aimed at improving software security, can succeed. ... » read more

Challenges Grow For 5G Packages And Modules
By Mark LaPedus - 18 Jul, 2019 - Comments: 0

The shift to 5G wireless networks is driving a need for new IC packages and modules in smartphones and other systems, but this move is turning out to be harder than it looks. For one thing, the IC packages and RF modules for 5G phones are more complex and expensive than today's devices, and that gap will grow significantly in the second phase of 5G. In addition, 5G devices will require an as... » read more

Silicon Photonics Begins To Make Inroads
By Kevin Fogarty and Ed Sperling - 09 Jul, 2019 - Comments: 1

Integrating photons and electrons on the same die is still a long way off, but advances in packaging and improvements in silicon photonics are making it possible to use optical communication for a variety of new applications. Utilizing light-based communication between chips, or in self-contained modules, ultimately could have a big impact on chip design. Photons moving through waveguides ar... » read more

5G OTA Test Not Ready For Production
By Kevin Fogarty - 09 Jul, 2019 - Comments: 0

5G is poised to dominate the wireless world, but over-the-air (OTA) testing of 5G beamforming antennas is still not ready for volume production. Beamforming is a critical element in the millimeter wave version of 5G, because of the limitations of ultra-high-frequency signals. Unlike 4G and its predecessors, millimeter wave technology will not penetrate objects, so signals need to be directed... » read more

Highlights From The Automotive Testing Expo 2019
By Daniel Riedelbauch - 09 Jul, 2019 - Comments: 0

Thousands of automotive engineers and enthusiasts visited the Automotive Testing Expo in Stuttgart, Germany, in May to see nearly 500 companies show off their latest technologies to test features such as active safety, vehicle electrification, and connectivity, among others. This blog features highlights of the expo and the Autonomous Vehicle Test and Development Symposium held in conjunction w... » read more

Advanced Features Of High Speed Digital I/O Devices: Double Data Rate
By NI - 08 Jul, 2019 - Comments: 0

As clock speeds and data rates continue to increase, designers of digital integrated circuits are creating new ways to maximize the rate of data being sent into and out of digital devices. One such method is known as double data rate (DDR). With single data rate (SDR) devices, data is latched on either the rising or falling edges of the sample clock. A DDR device latches data on both the rising... » read more

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